Particle characterization is a rich field that touches industries from mining to pharmaceutical production. There are a number of characterization techniques available to the modern analyst. Understanding them is key to selecting the right technique as well as gaining deeper insight into the meaning of measurement results.
This webinar is the beginning of a new series reviewing a number of modern measurement techniques. Dr. Michael Pohl, Vice President of HORIBA Scientific, will describe some common ideas in particle characterization along with common questions to ask when selecting a technique. Mike will also give a very brief overview of some modern techniques before subsequent webinars go into detail.
激光粒度分析仪
激光粒度分析仪
纳米颗粒追踪分析仪
Dynamic Image Analysis
纳米粒度及Zeta电位分析仪
离心式粒度分析仪
BET Surface Area Analyzers
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