TERS and TEPL Imaging for 2D Materials Research

Overview:
It would not be too much of exaggeration to state that Physics and Materials Science research of the first half of the 21-st century is being shaped by the amazing discoveries of 2D materials such as graphene, transition metal dichalcogenides (TMDs), black phosphorous and their heterostructures, both vertical and lateral. Raman spectroscopy and hyperspectral Raman imaging is extremely efficient for characterization of 2D materials. Quite often, the scale of structural or electronic or morphological heterogeneity in these materials, not to mention their heterostructures, is on the order of few tens of nanometers or less, which is beyond the spatial resolution of conventional Raman microscopy.
Tip enhanced Raman scattering (TERS) and tip enhanced photo- luminescence (TEPL) can enhance the spatial resolution. In this lecture we will:

• Demonstrate how TERS and TEPL imaging can probe a number of nanoscale heterogeneities in 2D crystals: growth related, including lateral and vertical heterostructures, substrate induced, and the morphological heterogeneities that appear (intentionally or not) in the process of exfoliation/ 2D crystal transfer
• Discuss the latest results on ultra-low frequency TERS imaging of homo- and heterobilayers of TMDs

Key Learning Objectives:

• Introduction to Tip-enhanced Raman scattering (TERS) imaging
• Application of TERS and TEPL imaging to characterization of defects and heterogeneities in 2D materials
• TERS Imaging for nanoscale spectroscopic characterization of lateral and vertical heterostructures of 2D materials

Who Should Attend:
Material scientists, Ph.D. students, post-docs in chemistry, materials, engineering, quantum materials.