Scientific

Spectromètres d'émission à décharge luminescente SDL

Instruments GDOES à radiofréquence pulsée

La technique GDOES permet une analyse ultra rapide du profil élémentaire en profondeur des matériaux multicouches, offrant une mesure quantitative de tous les éléments en fonction de la profondeur avec une résolution de l'ordre du nanomètre. Les instruments GDOES à radiofréquence pulsée d'HORIBA intégrant le profilage d'interférométrie différentielle (DiP) sont des outils de caractérisation de choix pour la recherche sur les matériaux et l'élaboration de processus.

La source RF pulsée innovante permet de profiler tous les types d'échantillons solides avec des performances optimales, du premier nanomètre à plus de 150 µm. Les matériaux polymères peuvent être parfaitement érodés grâce à la pulvérisation ultra rapide (UFS) brevetée. Cette source peut également être utilisée pour préparer les surfaces des échantillons pour la microscopie électronique à balayage (MEB).

Tous les éléments peuvent être mesurés, notamment l'hydrogène, le deutérium, le lithium, le carbone, l'azote ou l'oxygène.

Le profilage d'interférométrie différentielle (DiP) breveté permet de mesurer directement la profondeur en fonction du temps, avec une précision nanométrique, pendant l'analyse par décharge luminescente.

Les détecteurs brevetés à haute gamme dynamique (HDD) utilisés dans tous les instruments à décharge luminescente d'HORIBA permettent une optimisation automatique et en temps réel de la sensibilité, afin d'analyser les éléments à l'état de traces dans une couche, et présents comme majeurs dans une deuxième couche, sans compromis et sans ajustements préalables.

GD-Profiler 2™

GD-Profiler 2™ permet une analyse rapide et simultanée de tous les éléments d'intérêt, y compris l'azote, l'oxygène, l'hydrogène ou le chlore. Cet outil est idéal pour la caractérisation des films minces et épais et pour les études de processus de dépôt.
 

Formations



Nos formateurs sont des experts de la technique GDOES. Vous bénéficierez de formations et de conseils pour tirer le meilleur parti de votre instrument HORIBA.
Vous gagnerez en confiance et en expérience dans l'analyse de vos échantillons.

Technologie & FAQ

Spectrométrie Optique à Décharge Luminescente (GDOES)

La technique d'analyse GDOES permet d'établir rapidement les profils de composition élémentaire de matériaux et de couches solides, avec un niveau de sensibilité élevé pour tous les éléments. En savoir plus sur cette technique et son large éventail d'applications.

L'analyse élémentaire en action

Bienvenue à Science in Action. Notre nouvelle série vous présente nos technologies et nos applications (en anglais)

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Actualités

Webinar replay: Ageing Uncovered: Diagnosing Battery Health with Post-Mortem and In-Situ Analysis

Understanding how and why batteries degrade over time is essential for improving design and lifecycle performance.
In this webinar, explore HORIBA’s approach to ageing studies using µRaman, GD-OES, and SEI for both in-situ and ex-situ diagnostics. See how we map SEI growth, detect oxide formation, and follow structural changes in electrodes to predict performance decline and inform better material and process choices.

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Webinar replay: Revealing the Hidden Structure: Crystallinity and Layer Analysis for Battery Materials

Crystallinity and material structure are key to maximizing battery energy and power density. HORIBA’s µRaman and QCarbon tools offer direct access to carbon ID/IG ratios and coating uniformity, while GDOES reveal elemental depth profiles. This webinar guides you through essential characterization techniques for both carbon-based and cathode materials, empowering better design and quality control for next-gen batteries.

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Webinar replay: Coupling Glow Discharge and Raman for Elemental and Molecular Depth Profile Analysis of Surfaces & Interfaces

Surface and interface studies need complementary analytical techniques, like GDOES and Raman, to provide elemental profiles and molecular insights on multilayers of various depths. This webinar illustrates this complementarity by showing selected results on polymeric coatings, anodic films, batteries, coatings on glass and DLC coatings.

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Webinar replay: Shaping Power: The Role of Particle Characterization and Elemental Analysis in Electrode Efficiency

In this webinar, we explore how HORIBA’s integrated solutions, including particle characterization and MicroXRF, provide comprehensive characterization of carbon materials and cathode powders. While laser diffraction and centrifugal sedimentation systems analyze particle size distribution and dispersion state with high precision and minimal sample prep, MicroXRF reveals elemental composition and ratios within electrodes at microscale.

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Advanced Characterization of Organic Layers: Coupling Raman Spectroscopy and XRF with GD-OES

Application note: Advanced Characterization of Organic Layers: Coupling Raman Spectroscopy and XRF with GD-OES

GD-OES offers you a way to characterize the surface of under-layers by analyzing GD-OES craters using Raman and µ-XRF, confirming no alteration of the surface in complex organic/inorganic coatings.

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Application note: Depth Profile Analysis of Organic Coatings: A Novel Approach Using Glow Discharge Optical Emission Spectroscopy

GD-OES provides fast, uniform, and precise depth profiling of organic coatings using Ar/O₂ plasma, enhancing multilayer analysis capabilities.

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Combined Pulsed RF GD-OES and HAXPES for Quantified Depth Profiling through Coatings

The combination between pulsed GD OES and XPS, notably to look at embedded interfaces, is generating interest from the Surface community. Look at this open Access article published in Coatings.

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New GD-Profiler 2™ Brochure Available

Discover the new brochure for the GD-Profiler 2™, our Pulsed RF Glow Discharge Optical Emission Spectrometer, with Differential Interferometry Profiling (DiP) information and the latest functionalities and applications.

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Novel Porous Phosphorus–Calcium–Magnesium Coatings on Titanium with Copper or Zinc Obtained by DC Plasma Electrolytic Oxidation: Fabrication and Characterization

In this paper, the characteristics of new porous coatings fabricated at three voltages in electrolytes based on H3PO4 with calcium nitrate tetrahydrate, magnesium nitrate hexahydrate, and copper(II) nitrate trihydrate are presented. The SEM, energy dispersive spectroscopy (EDS), glow discharge optical emission spectroscopy (GDOES), X-ray photoelectron spectroscopy (XPS), and XRD techniques for coating identification were used.

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Real-time depth measurement in glow discharge optical emission spectrometry via differential interferometric profiling

We developed an in situ measurement technique implemented on a Glow Discharge Optical Emission Spectrometry (GDOES) instrument, which provides the depth information during the profiling process. The setup is based on a differential interferometer, and we show that a measurement accuracy better than 5% can be obtained for crater depths ranging from 100 nanometers to several tens of micrometers. This development can be directly applied to non-transparent coatings, and brings significant improvement to the quantification process in GDOES.

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Studying perovskite solar cells with HORIBA Scientific equipment

With their ~20 % efficiency, hybrid perovskite solar cells are the new promising candidate for next generation photovoltaics. Thanks to the wide HORIBA Scientific portfolio, different techniques can be used to gain in depth knowledge on the optoelectronic properties and mechanisms of this class of materials. In this application note we decided to use spectroscopic ellipsometry, steady-state and time-resolved fluorescence and Glow Discharge Optical Emission Spectroscopy to investigate the properties of CH3NH3PbI3 thin films deposited on a spin-coated PEDOT:PSS. The impact of the exposure to air was addressed.

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MoS2/Pb nanocomposite coatings for solid lubricants application

Pulsed RF Glow Discharge Optical Emission Spectrometry offers ultra-fast elemental depth profiling capability for the investigation of thin and thick films. Thanks to the use of a pulsed RF source, coupled with a high resolution optical spectrometer, the GD Profiler 2 provides an excellent depth resolution, allowing the fast evaluation of the coating quality. In this application note, we focus on a MoS2/Pb composite multilayered sample, used as a solid lubricant. The analysis of such a sample shows the excellent performance of this instrument for the study of nm-thick complex coatings.

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GD-Profiler 2™
GD-Profiler 2™

Spectromètre d'émission optique à décharge luminescente RF pulsée

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