HORIBA FRANCE SAS

HORIBA FRANCE SAS

HORIBA FRANCE SAS, headquartered in Palaiseau, brings together the activities of the scientific, process and environmental and automotive segments, and provides an extensive array of instruments and customized solutions. Our instruments are found in universities and industries around the world. Proven quality and trusted performance have established widespread confidence in the HORIBA brand. Based on the scientific know-how and knowledge of specific European, process, environment and automotive markets, HORIBA FRANCE SAS develops innovative solutions based on cutting-edge technology products and systems.

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HORIBA Scientific emailings and e-newletters

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Join us in shaping the future for the better and find your dream job at HORIBA. Discover all jobs in your region.

 

EQS Policy

HORIBA FRANCE SAS carries out concrete policies in Environment, Quality & Safety (EQS) in order to build a sustainable society, ensure good partnership with our stakeholders, and protect our planet.

Directions

How to find HORIBA FRANCE SAS in Palaiseau and Loos (Lille).


 

Latest News

LabRAM Odyssey Semiconductor Raman microscope for semiconductor analyses
|   Press Release

HORIBA debuts new Raman microscope for semiconductor analyses

LabRAM Odyssey Semiconductor for semiconductors R&D process qualification and optimization

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|   Press Release

French Company Tethys Instruments SAS joins HORIBA Group

Enhanced Capabilities/Product Lineup for System to Measure Water Quality

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Correlative analysis study on 2D heterostructures produced and exported using graphYX software
|   Press Release

HORIBA and Digital Surf partner to launch graphYX software range

For the correlative analysis of Raman, AFM, AFM-Raman, cathodoluminescence and fluorescence data and microscopy images (optical, scanning probe…

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Latest Events

Transforming Biotherapeutics Development: A PAT-Ready Analytical Platform for Biopharma

Transforming Biotherapeutics Development: A PAT-Ready Analytical…

|   Event

You are invited to register for our new webinar: Thursday, April 9th, at 9 AM (BST); 10 AM (CEST), or at 4 PM (BST); 5 PM (CEST)

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Caractérisation de la corrosion des surfaces métalliques et mise en évidence de la fragilisation par l’hydrogène par SDL

Caractérisation de la corrosion des surfaces métalliques et mise en…

|   Event

Webinaire en français / Webinar in French. Nous vous invitons à vous inscrire à ce webinar diffusé le mardi 7 avril 2026 à 11h, heure de Paris (10h,…

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What is Fluorescence, Part 1: Principles and Applications of Steady-State Techniques

What is Fluorescence, Part 1: Principles and Applications of…

|   Event

You are invited to register for our new webinar: Thursday, March 26th, at 9 AM (GMT); 10 AM (CET), or at 4 PM (GMT); 5 PM (CET)

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Speed and Innovation: Advanced Raman Solutions for Today’s Pharmaceutical Challenges

Speed and Innovation: Advanced Raman Solutions for Today’s…

|   Event

You are invited to register for our new webinar: Thursday, March 19th, at 9 AM (GMT); 10 AM (CET), or at 4 PM (GMT); 5 PM (CET)

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Ellipsometry basics: A powerful thin films characterization technique

Ellipsometry basics: A powerful thin films characterization technique

|   Event

You are invited to register for our new webinar: Thursday, February 26th, at 9 AM (GMT); 10 AM (CET), or at 4 PM (GMT); 5 PM (CET)

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Traceability in Correlative Microscopy: From Fiducial Alignment to Multimodal Visualization

Traceability in Correlative Microscopy: From Fiducial Alignment to…

|   Event

You are invited to register for our new webinar: Thursday, January 22nd, at 9 AM (GMT); 10 AM (CET), or at 4 PM (GMT); 5 PM (CET)

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Micro-XRF vs SEM-EDS: Complementarity and Limitations in Materials Analysis

Micro-XRF vs SEM-EDS: Complementarity and Limitations in Materials…

|   Event

You are invited to register for our new webinar: Thursday, January 15th, at 9 AM (GMT); 10 AM (CET), or at 4 PM (GMT); 5 PM (CET)

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STARS Platform: Test Automation and Battery-in-the-Loop for Next-Gen Validation

STARS Platform: Test Automation and Battery-in-the-Loop for Next-Gen…

|   Event

You are invited to register for our new webinar: Tuesday, December 16th, at 9 AM (GMT); 10 AM (CET), or at 4 PM (GMT); 5 PM (CET)

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Raman/PL deployment as a characterization/metrology tool for semiconductors

Raman/PL deployment as a characterization/metrology tool for…

|   Event

You are invited to register for our new webinar: Thursday, December 11th, at 9 AM (GMT); 10 AM (CET), or at 4 PM (GMT); 5 PM (CET)

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Accelerating EV Development and Reducing Cost Through Advance ML Solutions

Accelerating EV Development and Reducing Cost Through Advance ML…

|   Event

You are invited to register for our new webinar: Tuesday, December 9th, at 9 AM (GMT); 10 AM (CET), or at 4 PM (GMT); 5 PM (CET)

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Ageing Uncovered: Diagnosing Battery Health with Post-Mortem and In-Situ Analysis

Ageing Uncovered: Diagnosing Battery Health with Post-Mortem and…

|   Event

You are invited to register for our new webinar: Tuesday, November 18th, at 9 AM (GMT); 10 AM (CET), or at 4 PM (GMT); 5 PM (CET)

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Revealing the Hidden Structure: Crystallinity and Layer Analysis for Battery Materials

Revealing the Hidden Structure: Crystallinity and Layer Analysis for…

|   Event

You are invited to register for our new webinar: Thursday, October 30th, at 9 AM (GMT); 10 AM (CET), or at 4 PM (GMT); 5 PM (CET)

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