X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL allows X-ray fluorescence analysis at the microscopic level even on a large sample by using microprobes such as <15 µm and <100 µm ultra-high intensity probes. The X-ray generator can offer high output of X-ray irradiation up to 50 kV and 1000 µA. Thus, the high performance of the excitation system provides ultimate performance and flexibility for your large sample analysis.
Capturing clear images is critical for micro-XRF. XGT-9000SL provides two types of cameras to grasp the image of the whole sample and its details down to the microscopic level. Multiple illumination modes help to observe brilliant images, even for reflective and transparent samples.
XGT-9000SL’s large chamber capacity (1030 mm x 950 mm x 500 mm) can accommodate a wide variety of samples from micro-size fragments to samples as large as electronic circuit boards and paintings. XGT-9000SL is equipped with X-ray shields complying with JAIMAS0101-2001/IEC1010-1, which protect you from X-ray exposure. XGT-9000SL can allow sample analysis without destructive sample preparation or compromising your safety.
XGT-9000SL provides both a transmission X-ray detector and a fluorescent X-ray detector. The transmission X-ray detector enables users to detect internal defects and foreign matter of a sample. The fluorescent X-ray detector can detect from Americium down to carbon, with a light elements detector and He-purge module.
XGT-9000SL software, of course, covers all basic measurements such as single spot analysis, multiple spot analysis, line analysis, and map imaging. Apart from the standard software functions, advanced modules can be added to the software suite to provide more comprehensive user experiences. These include:
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|Instrument||X-ray fluorescence analytical microscope|
|Sample type||Solids, Liquids, Particles|
|Detectable elements||C* – Am with optional light elements detector|
F* – Am with standard detector
*He purge condition is necessary to detect down to carbon and fluorine for both detectors
|Available chamber size||1030(W) x 950(D) x 500(H)|
|Maximum sample size||500(W) x 500(D) x 500(H)|
|Maximum mass of sample||10 kg|
|Optical observation||Two high resolution cameras with objective lens|
|Optical design||Vertical-Coaxial X-ray and Optical observation|
|Sample illumination/observation||Top, Bottom, Side illuminations/Bright and Dark fields|
|Voltage||Up to 50 kV|
|Current||Up to 1 mA|
|Number of probes||Up to 4|
|Primary X-ray filters for spectrum optimization||5 positions|
|X-ray Fluorescence detector||Silicon Drift Detector (SDD)|
|Mapping area||350 mm x 350 mm|
|Step size||4 μm|
|Sample environment||Partial vacuum / Ambient condition / He purged condition (optional)*|
*He purge condition is necessary to detect down to carbon and fluorine for both detectors.
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