铜触头NiP/Au镀层厚度和成分的微区XRF无损分析
我们使用HORIBA 微区X射线荧光分析仪对柔性印刷电路上的铜触点上双层NiP/Au镀层进行了镀层厚度和成分分析。没有任何样品制备的情况下成功地检测到了超薄层中的金。金镀层和NiP镀层的厚度结果与预期值一致，且具有良好的重复性。
XGT-9000
X-ray Analytical Microscope (Micro-XRF)
Next evolution of micro-X-Ray Fluorescence Spectroscopy Ultimate performance in speed and flexibility
- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution
- High resolution cameras and multiple illumination modes to help capture images.
- Dual types of detectors for transmission and fluorescent X-rays
- Detectable element range down to carbon with a light element detector
>> Read about HORIBA’s contributions to the exploration and analysis of the Ryugu asteroid.
How the XGT-9000 provide the ultimate performance in speed and flexibility
Excitation systemXGT-9000 provides ultimate performance and flexibility with its well-designed excitation system. The X-ray generator has high output up to 50 kV and 1000 µA. In addition, primary X-rays can be irradiated through our wide selection of probe sizes (10 microns - 1.2 mm). This includes ultra-high intensity probes to achieve fast measurement speeds. |  |
Optical imagesCapturing clear images is critical for micro-XRF. XGT-9000 provides high resolution cameras to grasp the image of the whole sample and its details down to microscopic level. Multiple illumination modes help to observe brilliant images, even for reflective and transparent samples. |  |
Sample chamberXGT-9000 accommodates a wide variety of samples from micro-size fragments, printed circuit boards, coins, sheet, powder, liquid, wafers. Various kinds of sample holders can be provided. In addition, up to 4 measurement environments can be selected to pull up sensitivity. |  |
DetectorsXGT-9000 provides both a transmission X-ray detector and a fluorescent X-ray detector. The transmission X-ray detector enables users to detect internal defects and foreign matter of a sample. The fluorescent X-ray detector can detect from Americium down to carbon, with a light elements detector. |  |
Software suiteXGT-9000 software, of course, covers all basic measurements such as single spot analysis, multiple spot analysis, line analysis, and map imaging. Apart from the standard software functions, advanced modules can be added to the software suite to provide more comprehensive user experiences.
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Application Examples
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| Model | XGT-9000 | XGT-9000SL |
|---|---|---|
| Basic information | ||
| Instrument | X-ray fluorescence analytical microscope | |
| Sample type | Solids, Liquids, Particles | |
| Detectable elements | C* – Am *with optional light elements detector (F – Am with standard detector) | |
| Available chamber size | 450(W) x 500(D) x 80(H) | 1030(W) x 950(D) x 500(H) |
| Maximum sample size | 300(W) x 250(D) x 80(H) | 500(W) x 500(D) x 500(H) |
| Maximum mass of sample | 1 kg | 10 kg |
| Optical observation | Two high resolution cameras with objective lens | |
| Optical design | Vertical-Coaxial X-ray and Optical observation | |
| Sample illumination/observation | Top, Bottom, Side illuminations/Bright and Dark fields | |
| X-ray tube | ||
| Power | 50 W | |
| Voltage | Up to 50 kV | |
| Current | Up to 1 mA | |
| Target material | Rh | |
| X-ray optics | ||
| Number of probes | Up to 4 | |
| Primary X-ray filters for spectrum optimization | 5 positions | |
| Detectors | ||
| X-ray Fluorescence detector | Silicon Drift Detector (SDD) | |
| Transmission detector | NaI(Tl) | |
| Mapping analysis | ||
| Mapping area | 100 mm x 100 mm | 350 mm x 350 mm |
| Step size | 2 mm | 4 mm |
| Operating mode | ||
| Sample environment | Full vacuum / Partial vacuum / Ambient condition / He purged condition(Optional) | Partial vacuum / Ambient condition / He purged condition (optional)* *He purge condition is necessary to detect down to carbon and fluorine for both detectors. |
Dimensions (unit: mm)
Pigment identification of an old Japanese flag “Hinomaru” using micro-XRF and Raman microscopy
This application note introduces pigment identification using micro-XRF and Raman microscopy on a Japanese flag “Hinomaru”, which is presumed to be the oldest and designed by an ancient Japanese Emperor Go-Daigo. The two spectroscopic analyses identified that the red pigment used on the flag matched the cinnabar ore (Mercury(II) sulfide) mined from the Mine near the place where the Emperor lived.
Spectroscopic Analysis Explains the Mystery of Dragonfly Eye Beads
Spectroscopic analysis can reveal the origin of cultural heritages and the historical background at the time. This application note introduces research of a dragonfly eye bead found in a tomb in China. Using Raman spectroscopy and X-ray analytical microscopy, the bead was found to be from the Eastern Mediterranean region and the result suggested China had cultural and economic exchanges with them during that era.
Optical Micro-spectroscopies on a Path to Identify the Source of Life
In this article, we present how our Raman and X-Ray Fluorescence microscopies can be combined to shed some light on the origins of the universe. We show some examples on a meteorite piece and on water inclusion in quartz matrix.
Non-destructive Failure Analysis on Electronic Components Using the XGT-9000
μ-XRF is a non-destructive analytical technique which can inspect defects, even non-visible ones, inside a sample because of the high penetration of X-rays. This application note introduces failure analysis to detect ion migration, voids, and foreign matter on electronics using the XGT-9000, with key features of the vertical irradiation of a 10 μm probe and the simultaneous imaging of fluorescent X-rays and transmission X-rays.
Multiple Characterizations of a Blister Pack Using the XGT-9000
The XGT-9000 is HORIBA’s new X-ray microscope. Its analytical versatility allows, multiple characterizations to be performed on a blister pack, from mapping of the full pack to particle size measurements of the capsule content.
Characterization of Pyrite Inclusions in Lapis Lazuli Using X-ray Fluorescence Micro-imaging
Lapis lazuli is a deep-blue metamorphic rock used as a semiprecious stone which contains inclusions that can impact its value. Pyrite impurities and major elements distribution are studied with the XGT-9000, HORIBA’s new X-ray microscope.
Elemental Distribution Imaging on Edible Insects Using Micro-XRF
Edible insects have received attention as a possible solution as a supplemental source to reduce food insecurity because of their nutritional benefits such as protein, fat, and minerals. Micro-XRF can be used to understand the elemental distributions in insects non-destructively. In this application note, we carried out elemental map imaging on edible crickets using a HORIBA XGT-9000 X-ray analytical microscope and revealed the rich source of zinc in their jaws.
Foreign Matter Analysis in Food using the XGT 9000
This application note introduces foreign matter analysis in food products using the XGT 9000. There are three analyses as follows: Foreign particles on an oily salami, foreign matter inside a laminated ham and sausage, and a fly found in a drink product.
The non-destructive identification of black ink in a tempered document using XGT-9000
μ-XRF is one of the powerful non-destructive analytical technique in forensic science application. Thanks to the elemental mapping and the spectrum search function, XGT-9000 enables to reveal intentional alternation and identify the ink used on a document.
QC of Semiconductors which Feature Thin and Narrow Patterns
The combination of microbeam and thickness measurement capability makes the XGT-9000 a useful tool for the QC of semiconductors, which feature thin and narrow patterns. Thickness sensitivity depends on elements traced, but can be at the Angstrom level.
QC, Counterfeit Products, Presence of Foreign Materials
X-ray Fluorescence photons can be partially absorbed by the encapsulated material and will not show in the spectrum. The X-ray transmission image provides a complete picture.
Foreign particle analysis on separator film
The XGT-9000 can detect and determine the composition of foreign particles, and therefore track the source of contamination.
Trace Evidence Identification, Fake Product Identification of Forensic Samples
The XGT-9000 Series can be used for identification of trace evidences such as collected gunshot residues, glass fragments, and fibers with sizes even down to tens of micron.
Gun Shot Residue analysis using X-ray fluorescence micro-analysis
Micro-XRF analysis of gun shot residues allows individual microscopic particles to be characterized for elemental composition. In addition, automated element imaging provides high spatial resolution element distribution maps, allowing particle shapes and sizes to be accurately analyzed.
X-ray micro-analysis for pearl characterisation in forensic science
Simultaneous XRF and transmission x-ray imaging provides valuable insight into the composition and structure of pearls. Such information is vital for customs officials, who can quickly determine whether pearls are natural, cultured or imitation.
Fingerprint imaging with micro-XRF
High spatial resolution elemental mapping experiments are demonstrated to provide a useful method of fingerprint analysis in situations where traditional methods struggle. Fingerprints on glossy paper and finely woven fabrics have been chemically treated, and subsequently imaged.
Micro-XRF analysis for lead contamination in toys
A plastic toy is analysed for the presence of lead within its many components. Spot analysis shows concentrations of this harmful element can reach as high as 0.3%. XRF imaging allows its distribution across the toy to be quickly characterised.
Fast thickness measurement of thin metal coatings by Micro-XRF
The penetrating nature of EDXRF analysis allows multi-layered samples to be characterised with a single measurement. With high spatial resolution even microscopic features such as bonding pads on circuit boards can be interrogated for composition and layer thickness.
Quality control and defect analysis in the electronics industry using micro-XRF
Troubleshooting and defect analyses of components embedded within opaque resins are described, on both individual components and complete circuit boards. Quantitative analysis to the ppm level is ideally suited for ensuring compliance to the WEEE/RoHS directives.
Micro-XRF analysis for the Electronics Industry
The combination of the XGT-5000’s ground breaking spatial resolution and sensitivity means it is the instrument of choice for fast analysis of electronic components, whether for analysis of restricted harmful elements (the WEEE/RoHS ‘lead free’ legislation), trouble shooting, or R&D.
Elemental analysis of single rice grains using XRF micro-analysis
Individual rice grains are analyzed by micro-XRF to examine the effect of grain polishing. The concentration of mineral elemnts found on a grain can be related to the degree of polish.
Elemental micro-analysis of leaves using EDXRF
Calcium micro-nodules are identified within mulberry leaves, and XRF mapped imaging provides a correlation between nodule concentration and leaf age. In a seperate study, the uptake of heavy element pollutants by plants is investigated, with high resolution images quickly acquired to show the distribution of lead through the leaf.
Biological applications of XRF microscopy
The effect of zinc on gastric ulcer healing has been investigated - mapped imaging of tissue samples shows evidence of zinc accumulation within the ulcerated tissue. In a separate study a fish otolith ('ear bone') has been analysed to reveal its heterogeneous elemental composition and physical structure.
Micro-XRF for non destructive analysis of museum and archaeological objects
Pigments used in an ancient Nepalese manuscript have been analysed and assigned and an ancient glass burial ornament has been probed to identify the specific colouring additives used.
