Measuring techniques are necessary for the analysis and development of next-generation materials. HORIBA supports your new material development and quality control with specialized measuring techniques.
Overview of All Material Interests:
Film thickness
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| Optical Constants
| Band gap
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Roughness
| Crystallinity
| Stoichiometry
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Stress/Strain
| Defect Analysis
| Impurity Analysis
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Doping Concentration
| Carrier Concentration
| Elemental Composition
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Chemical Identification
| Chemical Concentration
| Carrier Lifetime
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Surface Potential
| Layers of 2D Materials
| Electrical Properties
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Particle Analysis
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In-situ spectroscopic ellipsometer for real-time thin film monitoring
In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
Spectroscopic Ellipsometer for Simple Thin Film Measurement
Modular Research Fluorometer for Lifetime and Steady State Measurements
Fluorescence and Absorbance Spectrometer
Confocal Raman Microscope
Cathodoluminescence Solutions for Electron Microscopy
Mid-Focal Length Imaging Spectrometers
Confocal Raman Microscope
Multimodal Confocal Raman Microscope
Add Spectroscopy to ANY Microscope
Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer
Ultra-Fast, Sensitive and High Resolution Depth Profiling technique
Oxygen/Nitrogen Analyzer
Complete your ICP-OES Spectrometer for your specific needs
X-ray Analytical Microscope (Micro-XRF)
X-ray Analytical Microscope Super Large Chamber Model
TCSPC Lifetime Fluorometer
AFM-Raman for Physical and Chemical imaging
AFM-Raman for physical and chemical imaging
Simultaneous Multi-Laser Nanoparticle Tracking Analysis (NTA)
Do you have any questions or requests? Use this form to contact our specialists.
