The photoluminescence method can evaluate the composition, defects, quantum wells, impurities, crystallinity of compound semiconductors in a non-destructive and non-contact manner. In silicon semiconductors, it is used for analyzing trace impurities in silicon.
We can meet a wide range of needs, from basic research to mapping measurements for quality inspections, with our customization capabilities unique to a spectrometer manufacturer.
Confocal Raman Microscope
Multimodal Confocal Raman Microscope
Add Spectroscopy to ANY Microscope
X-ray Analytical Microscope (Micro-XRF)
X-ray Analytical Microscope Super Large Chamber Model
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