MESA-50K

X선 형광 분석기

RoHS/ELV (환경 유해 물질)에 대응하는 X선 형광 분석기 MESA-50 시리즈

2002년부터 전 세계 1000대 이상의 장비가 RoHS/ELV 분석을 위해 샘플을 절단하지 않고 분석해야 했습니다. 이런 기대에 부응하여, 2012년 XGT-1000WR의 후속 모델인 MESA-50 X선 형광 분석기가 출시되었습니다. 출시 후 단기간 안에 판매량이 급증하였으며 2013년에는 MESA-50 시리즈에 큰 샘플 챔버를 갖춘 MESA-50K가 추가되었습니다.
정교한 LN2-free 검출기가 장착되어 있으며, As/Sb 분석 기능과 Multilayer Film FPM의 기능도 추가 가능합니다.

Segment: Scientific

Division: X-Ray Fluorescence Spectroscopy

Manufacturing Company: HORIBA, Ltd.

1. Speedy

Silicon Drift Detector (SDD) drastically reduces measurement times, and provides increased sensitivity, for true high throughput analysis.

2. Small

The MESA-50K features a large sized chamber without compromising the minimum footprint. Can be simply connected to PC via USB.

3. Simple

Reduce routine maintenance work (LN₂ free operation)
No need for vacuum pumps
Intuitive simple measurement process for all material types

4. Smart

English / Japanese / Chinese user interfaces
Excel^® data management tool

5. Safe

No worry about X-ray leakage

Options & Consumables

Basic Items	Principle	Energy dispersive X-ray fluorescence spectrometry
	Target application	RoHS, ELV, Halogen Free
	Meas. Elements	13Al - 92U
	Sample type	Solid, Liquid, Powder
X-ray generator	X-ray tube	Max 50kV, 0.2mA
	X-ray irradiation size	1.2mm, 3mm, 7mm (Automatic switching)
	X-ray primary filter	4 types (Automatic switching)
Detector	Type	SDD (Silicon Drift Detector)
Detector	Signal processor	Digital pulse processor
Sample chamber	Atmosphere	Air
	Sample observation	CCD camera
	Chamber size	460 x 360 x 150 mm [W x D x H]
Utility	Operation	PC (Windows^® 7)
Utility	Power supply	100-240V, 50/60Hz
Dimensions		590 x 590 x 400 mm [W x D x H]
Weight		60 kg
Software	Analysis Function	Multilayer Film FPM (Optional), Sb/As analysis (Optional)

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Non-destructive Thickness and Composition Analysis of Coatings on Steel Using MESA-50

Steel coating plays an important role in preventing corrosion of steel samples. Therefore, an understanding of coatings can help in improving the steel properties. XRF is a powerful technique for measuring thickness and composition of coatings. We carried out non-destructive thickness and composition analysis of Zinc-Nickel coating on steel using the MESA-50 X-ray fluorescence analyzer.

Solid Waste Combustors and Incinerators in Solid Waste Management and Remediation Services

Micro-XRF analysis for the Electronics Industry

The combination of the XGT-5000’s ground breaking spatial resolution and sensitivity means it is the instrument of choice for fast analysis of electronic components, whether for analysis of restricted harmful elements (the WEEE/RoHS ‘lead free’ legislation), trouble shooting, or R&D.

Micro-XRF analysis for lead contamination in toys

A plastic toy is analysed for the presence of lead within its many components. Spot analysis shows concentrations of this harmful element can reach as high as 0.3%. XRF imaging allows its distribution across the toy to be quickly characterised.

Size: 10.08 MB

MESA-50 catalog