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AFM-Raman presentation
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Nano Spectroscopy Solutions with AFM-Raman, TERS, NSOM
HORIBA's leading Raman technology is now integrated with Atomic Force Microscopy (AFM). The end result is a more comprehensive sample characterization in one versatile instrument, for fast simultaneous co-localized AFM-Raman measurements, Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL).