Elemental distribution is crucial for material science. The XGT-9000 Series provides this information non-destructively. Unlike SEM-EDS, it can analyze non-conductive samples without carbon or metal coating treatment. With the light elements detector, it is used for instances in corrosion studies.
Sample: Fe plate partially corroded
У вас есть вопросы или пожелания? Используйте эту форму, чтобы связаться с нашими специалистами.
X-ray Analytical Microscope (Micro-XRF)
