
Model | XGT-9000 | XGT-9000SL |
---|---|---|
Basic information | ||
Instrument | X-ray fluorescence analytical microscope | |
Sample type | Solids, Liquids, Particles | |
Detectable elements | C* – Am *with optional light elements detector (F – Am with standard detector) | |
Available chamber size | 450(W) x 500(D) x 80(H) | 1030(W) x 950(D) x 500(H) |
Maximum sample size | 300(W) x 250(D) x 80(H) | 500(W) x 500(D) x 500(H) |
Maximum mass of sample | 1 kg | 10 kg |
Optical observation | Two high resolution cameras with objective lens | |
Optical design | Vertical-Coaxial X-ray and Optical observation | |
Sample illumination/observation | Top, Bottom, Side illuminations/Bright and Dark fields | |
X-ray tube | ||
Power | 50 W | |
Voltage | Up to 50 kV | |
Current | Up to 1 mA | |
Target material | Rh | |
X-ray optics | ||
Number of probes | Up to 4 | |
Primary X-ray filters for spectrum optimization | 5 positions | |
Detectors | ||
X-ray Fluorescence detector | Silicon Drift Detector (SDD) | |
Transmission detector | NaI(Tl) | |
Mapping analysis | ||
Mapping area | 100 mm x 100 mm | 350 mm x 350 mm |
Step size | 2 μm | 4 μm |
Operating mode | ||
Sample environment | Full vacuum / Partial vacuum / Ambient condition / He purged condition(Optional) | Partial vacuum / Ambient condition / He purged condition (optional)* *He purge condition is necessary to detect down to carbon and fluorine for both detectors. |