MESA-50

X-Ray Fluorescence Analyzer

HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.

XGT systems are used daily throughout the world.  HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.

HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.

 

Сегмент: Scientific
Подразделение: X-Ray Fluorescence Spectroscopy
Производитель: HORIBA, Ltd.

1. Speedy

  • Silicon Drift Detector (SDD) drastically reduces measurement times, and provides increased sensitivity, for true high throughput analysis.

2. Small

  • Portable, small footprint and light weight
  • Internal battery power supply

3. Simple

  • Reduce routine maintenance work (LN2 free operation)
  • No need for vacuum pumps
  • Intuitive simple measurement process for all material types

4. Smart

  • English / Japanese / Chinese user interfaces
  • Excel® data management tool

5. Safe

  • No worry about X-ray leakage
Basic Items

 
PrincipleEnergy dispersive X-ray fluorescence spectrometry
Target applicationRoHS, ELV, Halogen Free
Meas. Elements13Al - 92U
Sample typeSolid, Liquid, Powder
X-ray generator

 
X-ray tubeMax 50kV, 0.2mA
X-ray irradiation size1.2mm, 3mm, 7mm (Automatic switching)
X-ray primary filter4 types (Automatic switching)
Detector
 
TypeSDD (Silicon Drift Detector)
Signal processorDigital pulse processor
Sample chamber
 
AtmosphereAir
Sample observationCCD camera
Utility

 
OperationPC (Windows® 7)
Power supply
 
AC adapter (100-240V, 50/60Hz)
Battery
Non-destructive Thickness and Composition Analysis of Coatings on Steel using MESA-50
Non-destructive Thickness and Composition Analysis of Coatings on Steel using MESA-50
Steel coating plays an important role in preventing corrosion of steel samples. Therefore, an understanding of coatings can help in improving the steel properties. XRF is a powerful technique for measuring thickness and composition of coatings. We carried out non-destructive thickness and composition analysis of Zinc-Nickel coating on steel using the MESA-50 X-ray fluorescence analyzer.
Fast, easy and safe control of Zn-Ni galvanization baths with MESA-50, a portable EDXRF
Fast, easy and safe control of Zn-Ni galvanization baths with MESA-50, a portable EDXRF
The EDXRF technique is used for the elemental analysis not only of solids, but also of liquids such as plating solution thanks to dedicated sample cells. This specific example shows the ability of MESA-50 for electrolytic baths follow-up by characterizing the degradation of Zn-Ni galvanization baths.
Micro-XRF analysis for the Electronics Industry
Micro-XRF analysis for the Electronics Industry
The combination of the XGT-5000’s ground breaking spatial resolution and sensitivity means it is the instrument of choice for fast analysis of electronic components, whether for analysis of restricted harmful elements (the WEEE/RoHS ‘lead free’ legislation), trouble shooting, or R&D.
Micro-XRF analysis for lead contamination in toys
Micro-XRF analysis for lead contamination in toys
A plastic toy is analysed for the presence of lead within its many components. Spot analysis shows concentrations of this harmful element can reach as high as 0.3%. XRF imaging allows its distribution across the toy to be quickly characterised.

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