Real-time and Direct Correlative Nanoscopy
Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
Multi-sample analysis platform
Macro, micro and nano scale measurements can be performed on the same AFM-Raman platform.
Multi-technique / Multi-environment
Numerous SPM (scanning probe microscopy) modes including AFM, force curves measurements, conductive and electrical modes (cAFM, KPFM), STM, liquid cell and electrochemical environment, together with chemical mapping through TERS/TEPL. Full control of the acquisition through one workstation and a powerful software control. SPM and Raman/PL microscope can be operated simultaneously or independently.
Compatible with the AFM chamber for environmental control, humidity control and cooling sample holder.
Robustness / Stability
High resonance frequency AFM scanners. High performance is obtained without active vibration isolation.
Fully automated operation, start measuring within minutes, not hours!
High collection efficiency
Top-down and oblique Raman/PL detection with high numerical aperture objectives for optimum resolution and throughput in both co-localized and tip-enhanced measurements (Raman and Photoluminescence).
High throughput multimodal UV-VIS-NIR achromatic platform
Designed for Raman, Photoluminescence, Ultra Low Frequency Raman, Upconversion Luminescence, Electroluminescence and more.
Up to 4 internal lasers and 6 different filters; 4-grating turret.
High spatial resolution
Nanoscale spectroscopic resolution (down to 10 nm) through Tip-Enhanced Optical Spectroscopies (TERS: Tip-Enhanced Raman Spectroscopy, and TEP: Tip-Enhanced Photoluminescence).
Super-low cut-off frequency down to 30 cm-1 with high throughput
Ultrafast Raman imaging
SmartSampling™ - 100 times faster Raman maps - turns hours into minutes
3D Raman lightsheet confocal imaging with patented Q-Scan™
Sample scanning range: 100 µm x 100 µm x 15 µm (±10 %)
Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %
Noise: 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth
Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)
X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm
Sample size: Maximum 40 x 50 mm, 15 mm thickness
Sample positioning: Motorized sample positioning range 5 x 5 mm
Positioning resolution: 1 µm
Laser wavelength: 1300 nm, non-interfering with spectroscopic detector
Registration system noise: Down to < 0.1 nm
Alignment: Fully automated cantilever and photodiode alignment
Probe access: Free access to the probe for additional external manipulators and probes
Contact AFM in air/(liquid optional); Semicontact AFM in air/(liquid optional); Non -contact AFM; Phase imaging; Lateral Force Microscopy (LFM); Force Modulation; Conductive AFM (optional); Magnetic Force Microscopy (MFM); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Capacitance and Electric Force Microscopy (EFM); Force curve measurement; Piezo Response Force Microscopy (PFM); Nanolithography; Nanomanipulation; STM (optional); Photocurrent Mapping (optional); Volt-ampere characteristic measurements (optional)
Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy
Tip-Enhanced Raman Spectroscopy (TERS) & Tip-Enhanced Photoluminescence (TEPL) in AFM, STM, and shear force modes
Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)
Capability to use simultaneously top and side plan apochromat objective: Up to 100x, NA = 0.7 from top or side; Up to 20x and 100x simultaneously
Closed loop piezo objective scanner for ultra stable long term spectroscopic laser alignment: Range 20 µm x 20 µm x 15 µm; Resolution: 1 nm
Wavelength range: UV-VIS-NIR; Broadband high throughput achromatic mirror-based system, optimized from 300 nm to 1600 nm without changing optics.
Built-in lasers: Up to 4 Solid-state lasers, NUV to NIR wavelengths available.
External lasers: Unlimited, for large gas and ultrafast lasers typically.
Spectrometer scanning speed: Up to 400 nm/s, with 600g/mm grating, mounted on standard 4-grating turret.
Number of gratings: unlimited; 4-grating exchangeable motorized turret.
Fast Imaging: <1ms/spectrum SWIFT, SWIFT XS EMCCD, SWIFT repetitive, SWIFT eXtended Range and SmartSampling for ultrafast imaging.
Standard wavenumber cut-off: 30 cm-1, with edge filters for 532, 638 and 785 nm wavelengths, injection rejection, >99% transmission.
Low wavenumber cut-off: 5 cm-1, with optional VBG filters, >70% transmission.
Integrated software package including full featured SPM, spectrometer and data acquisition control, spectroscopic and SPM data analysis and processing suite, including spectral fitting, deconvolution and filtering, optional modules include univariate and multivariate analysis suite (PCA, MCR, HCA, DCA), particle detection and spectral search functionalities.
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