This application note reports on nano-characterization with AFM-Raman of 2D transition metal dichalcogenides (TMDCs) materials which are considered of very high potential semiconductors for future nanosized electronic and optoelectronic devices. Scanning probe microscopy giving access to the critical topographic and electronic properties at the nanoscale is coupled to photoluminescence (PL) and Raman spectroscopies by means of plasmon enhancement to yield correlated electrical and chemical information down to the nanoscale.
AFM-Raman pour l'imagerie physique et chimique
AFM-Raman pour l'imagerie physique et chimique
Plateforme optique AFM
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