Ultra-thin film makes it difficult to measure film thickness and refractive index
Exhibition Panels
Material & Thin Film Characterization
Various analytical measurement technologies for evaluation of physical properties and thin films
Chemical Mechanical Planarization
Various analytical measurement technologies in the CMP process
Product Catalogs
Scientific Product Navi
Your Partner in Science
Semiconductor Navi
Smart Car
Raman Navi
Product Lineup of Raman Spectroscopy
Raman Spectrometer
LabRAM HR Evolution
Raman Microscope
LabRAM Soleil
AFM Raman
Nano Raman
Raman Spectrometer
MacroRAM
Ellipsometer for Thin Film Measurements
UVISEL Plus
Spectroscopic Ellipsometer for Simple Thin Film Measurement
Auto SE
Glow Discharge Optical Emission Spectrometer
GD Profiler
Cathodoluminescense
CLUE Series
Fluorescence Spectrometer
Fluorolog QM
TCSPC Lifetime Fluorometer
DeltaFlex
Fluorescence and Absorbance Spectrometer
Duetta
Centrifugal Nanoparticle Analyzer
Partica CENTRIFUGE
Nanoparticle Analyzer
Nano Partica SZ-100V2 Series
Laser Scattering Particle Size Distribution Analyzer
Partica LA-960V2
Laser Scattering Particle Size Distribution Analyzer
Partica LA-960V2 Series Optional
Oxygen & Nitrogen Analyser
EMGA-Pro / Expert
X-Ray Analytical Microscope
XGT-9000
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