
Ultra-thin film makes it difficult to measure film thickness and refractive index
Exhibition Panels
Various analytical measurement technologies in the CMP process
Measurement of quantum dot emission and emission lifetime
Various analytical measurement technologies for evaluation of physical properties and thin films
Various customizations from plasma diagnosis to process end point detection and chamber state management
Product Catalogs
Partica Centrifuge
Partica LA-960V2
NanoPartica SZ-100V2
CS-900
UP-100
UVISEL Plus
Duetta
DeltaFlex
Auto SE
HORIBA CLUE Series
LabRAM HR Evolution
XGT-9000
LabRAM Soleil
GD-Profiler2
XploRA Nano
IR-300
EMGA-Pro / Expert
Fluorolog-QM
VS70-MC
OES-Star
iHR Series
PoliSpectra® M116 MultiTrack Spectrometer
VU90 Spectrometer
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