Semiconductor Page Heading

Material Characterization

Ultra-thin film makes it difficult to measure film thickness and refractive index

Exhibition Panels

Material & Thin Film Characterization

Various analytical measurement technologies for evaluation of physical properties and thin films

Chemical Mechanical Planarization

Various analytical measurement technologies in the CMP process

Product Catalogs

Scientific Product Navi

Your Partner in Science

Semiconductor Navi

Smart Car

Raman Navi

Product Lineup of Raman Spectroscopy

Raman Spectrometer

LabRAM HR Evolution

 

Raman Microscope

LabRAM Soleil

 

AFM Raman

Nano Raman

 

Raman Spectrometer

MacroRAM

Ellipsometer for Thin Film Measurements

UVISEL Plus

Spectroscopic Ellipsometer for Simple Thin Film Measurement

Auto SE

 

Glow Discharge Optical Emission Spectrometer

GD Profiler

Cathodoluminescense

CLUE Series

Fluorescence Spectrometer

Fluorolog QM

 

TCSPC Lifetime Fluorometer

DeltaFlex

Fluorescence and Absorbance Spectrometer

Duetta

Centrifugal Nanoparticle Analyzer

Partica CENTRIFUGE

Nanoparticle Analyzer

Nano Partica SZ-100V2 Series

Laser Scattering Particle Size Distribution Analyzer

Partica LA-960V2

Laser Scattering Particle Size Distribution Analyzer

Partica LA-960V2 Series Optional

Oxygen & Nitrogen Analyser

EMGA-Pro / Expert

X-Ray Analytical Microscope

XGT-9000

Request for Information

Do you have any questions or requests? Use this form to contact our specialists.

* These fields are mandatory.

Corporate