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Material Characterization

Ultra-thin film makes it difficult to measure film thickness and refractive index

Exhibition Panels

Material & Thin Film Characterization

Various analytical measurement technologies for evaluation of physical properties and thin films

Chemical Mechanical Planarization

Various analytical measurement technologies in the CMP process

Product Catalogs

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Raman Navi

Product Lineup of Raman Spectroscopy

Raman Spectrometer

LabRAM HR Evolution

Raman Microscope

LabRAM Soleil

AFM Raman

Nano Raman

Raman Spectrometer

MacroRAM

Ellipsometer for Thin Film Measurements

UVISEL Plus

Spectroscopic Ellipsometer for Simple Thin Film Measurement

Auto SE

Glow Discharge Optical Emission Spectrometer

GD Profiler

Cathodoluminescense

CLUE Series

Fluorescence Spectrometer

Fluorolog QM

TCSPC Lifetime Fluorometer

DeltaFlex

Fluorescence and Absorbance Spectrometer

Duetta

Centrifugal Nanoparticle Analyzer

Partica CENTRIFUGE

Nanoparticle Analyzer

Nano Partica SZ-100V2 Series

Laser Scattering Particle Size Distribution Analyzer

Partica LA-960V2

Laser Scattering Particle Size Distribution Analyzer

Partica LA-960V2 Series Optional

Oxygen & Nitrogen Analyser

EMGA-Pro / Expert

X-Ray Analytical Microscope

XGT-9000

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