OLED devices, which are considered as the display technology of the future, are currently used as displays for MP3 players, cell phones and other small/medium-sized applications. Compared to LCD devices, they combine superior viewing angles and response times with lower power consumption, higher color saturation and can also be more efficiently manufactured. However, OLED devices degrade when exposed to air and water and hermetic sealing from the environment is required. Conventional methods to protect OLED devices are based on applying a metal ot glass cap filled with inert atmosphere and a desiccant.
In this Application Note Spectroscopic Ellipsometry, a standard optical characterization technique used to measure multi-layered thicknesses and optical constants (n,k), has been successfully used to characterize encapsulated OLED devices. This report also investigates the aging process of OLED.
Three OLED samples have been characterized using the Horiba Jobin Yvon Spectroscopic Phase Modulated Ellipsometer.
Spectroscopic ellipsometry is a powerful technique to characterize the thickness and optical constants of encapsulated OLED devices. For the case of non-transparent encapsulation the combination of ellipsometric measurements via the glass substrate and the powerful modelling features of DeltaPsi2 software make it possible to analyze “this reverse sample”.
Ellipsometric investigation of a 1-month aging process of an α-NPD film show a significant decrease of the refractive index, suggesting a decrease in the material density.
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