Physics

Physics deals with the structure of matter and how the fundamental components of the universe interact. HORIBA provides analysis solutions for a variety of areas, including the structure of order and disorder in solids. The electron correlations in quantum materials and superconductors.

The LabRAM for example is a unique bench-top system that combines Micro Raman and photoluminescence spectroscopy in a single instrument providing non-destructive, non-invasive techniques. The combination of the two in one instrument dramatically increases throughput in quality control and research applications alike. They are also used to study materials such as Si, InGaAs, InP, GaN, SiGe, GaAs, GaSb,InSb, and SiC. While the FluoroLog and FluoroMax Spectrofluorometers measure steady-state and time resolved photoluminescence and quantum yields.

Interest of the Month

Duetta Fluorescence and Absorbance spectrometer

Duetta - Fluorescence and Absorbance Spectrometer

Duetta™ is a spectrofluorometer that combines, simultaneously, the functions of fluorescence and absorbance spectrometers.

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How Inner-Filter Effects (IFE) can affect your fluorescence measurements: A case study - Colloidal InP Quantum Dots

During the last two decades, a great deal of attention has been focused on the optoelectronic properties of nanostructured semiconductors or Quantum Dots (QDs).

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Applications

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PLQY in NIR with Fluorolog-QM and K-Sphere
The Fluorolog-QM fluorescence spectrometer with an integrating sphere option is an excellent choice for PLQY measurements in NIR. The K-Sphere is very convenient and easy to use, as it couples directly to the sample compartment optics and allows a use of external light sources, such as DPSS lasers, which can be attached to the front of the sample compartment. The sphere has holders for cuvettes, slides and powders that can be easily interchanged. The results demonstrate very good reproducibility and precision for NIR PLQY measurements spanning almost two orders of magnitude. Based on multiple measurements, the demonstrated PLQY standard deviations range from 1.3% for high QY value (77%) to 6.4% for the QY below 1%.
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Evaluation of Diameter (Thickness) and Aggregation/Dissociation State of Carbon Nanotube Dispersions
Carbon nanotubes (CNTs) are thin, light, and flexible string-like materials that are composed entirely of carbon atoms. CNTs easily aggregate, so it is essential to understand and control the state of aggregation in order to achieve the expected performance. For this purpose, an analytical method that can quickly evaluate wide particle size distributions (PSD) from isolated dispersion to aggregation, with high resolution, is necessary.
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PLQY in NIR with Fluorolog-QM and K-Sphere
The Fluorolog-QM fluorescence spectrometer with an integrating sphere option is an excellent choice for PLQY measurements in NIR. The K-Sphere is very convenient and easy to use, as it couples directly to the sample compartment optics and allows a use of external light sources, such as DPSS lasers, which can be attached to the front of the sample compartment. The sphere has holders for cuvettes, slides and powders that can be easily interchanged. The results demonstrate very good reproducibility and precision for NIR PLQY measurements spanning almost two orders of magnitude. Based on multiple measurements, the demonstrated PLQY standard deviations range from 1.3% for high QY value (77%) to 6.4% for the QY below 1%.
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MoS2/Pb nanocomposite coatings for solid lubricants application
Depth profile analysis by GDOES. Pulsed RF Glow Discharge Optical Emission Spectrometry offers ultra-fast elemental depth profiling capability for the investigation of thin and thick films. Thanks to the use of a pulsed RF source, coupled with a high resolution optical spectrometer, the GD Profiler 2 provides an excellent depth resolution, allowing the fast evaluation of the coating quality. In this application note, we focus on a MoS2/Pb composite multilayered sample, used as a solid lubricant. The analysis of such a sample shows the excellent performance of this instrument for the study of nm-thick complex coatings.
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Ellipsometric Characterization and Modeling of Different Types of Nanoparticles
UVISEL ellipsometers have been used for the characterization of several systems of nanoparticles. This ellipsometric characterization involves the development of specific modeling tools available within DeltaPsi2 software. Through this report we illustrate the application of ellipsometry to the characterization of nanoparticle based samples. Our goal is to demonstrate that the technique can apply within a large panel of materials science. The HORIBA ellipsometric product line offers the most versatile hardware of the UVISEL series combined with the DeltaPsi2 software including unique modeling features to get the most of your applied work on this fascinating domain of modern physics.
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Mapping of the nanowire performed by recording step-spectra at every 200 nm with an integration time of 1s.
Raman Imaging of a Single Gallium Nitride Nanowire: Pushing the Limits of Confocal Microscopy
We have performed a complete Raman polarized study of a single GaN nanowire using a confocal microscope together with a high resolution stage. The high spatial resolution of our Raman confocal instrument together with a piezoelectric stage demonstrates unambiguously the possibility to image the optical properties of nano-objects with a resolution better than 200 nm keeping the fill advantage of the polarization control under a confocal microscope.
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Multimodal spectroscopy techniques for nanostructured materials characterization
Multimodal spectroscopy techniques for nanostructured materials characterization
In this article, we present the combination of Raman spectroscopy, Photoluminescence and SEM-CL techniques, where the instruments weren’t physically connected. Smart nanostructured materials require a comprehensive understanding of their morphology, elemental and chemical composition. nanoGPS Suite solution allows a colocalized combination of a variety of microscopy techniques, providing a full characterization of nanostructured materials and a precise superimposition of the results obtained.
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Particle Size Analysis of Fumed Silica
Chemical Mechanical Polishing (CMP) technology is used as an indispensable fundamental technology in the manufacturing process of ultra-large-scale semiconductor integrated circuits (ULSI). CMP is a technique in which the surface of a substrate is softened, removed or flattened by chemical etching and frictional abrasion with a chemical slurry that contains abrasive particles. Fumed silica abrasive particles are synthesized in a gas phase reaction in flame and are dispersed as secondary particles that are aggregates of primary particles. They are known to have thiogenic properties. Although the rate of polishing is high for fumed silica, its polishing precision is inferior to that of colloidal silica.

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