Emerging display technologies demand high brightness, low power consumption and longer lifetime. Arrays, of self-emitting, micron-sized LEDs or Micro-LED (µLED), are considered a strong contender to replace current OLED or LCD displays.

This application note demonstrates how deep-UV optimized HORIBA multimodal SMS can be applied to characterize PVT-grown 4H-SiC substrates, as well as epitaxial 4H-SiC structures.

Raman spectroscopy is an essential tool for the characterization of semiconductors. However, Raman spectroscopy's spatial resolution is limited by the diffraction limit to about 200-300 nanometers, which can be insufficient for analyzing the increasingly smaller features of modern electronic devices.

Raman spectroscopy enables precise, non-destructive stress analysis in 4H-SiC semiconductors. This study shows how peak shifts in Raman spectra reveal stress variations from surface treatments like cutting, lapping, and CMP—supporting quality control and process optimization in electronics.

胶体二氧化硅被用于非常精确的抛光，对它的粒度控制有着极高的要求。离心式粒度分析仪可以方便地进行高分辨率和重复性的测量，有助于CMP浆料的研发和质量控制。

碳纳米管(CNTs)是一种完全由碳原子组成的薄、轻、柔性的弦状材料。CNTs容易聚集，因此了解和控制其聚集状态是达到预期性能的关键。为此，需要一种能够快速评估从孤立分散到聚集的宽粒径分布(PSD)的高分辨率分析方法。 本文使用 Partica CENTRIFUGE 离心式纳米粒度分析仪，对三家公司的四种碳纳米管进行了测量。表明了分析仪的颗粒表征能力，将有助于碳纳米管的性能评估和质量控制。

硅片中氧的浓度对硅片的电阻有很大影响。因此，即使硅片中仅含有极少量的氧，对其浓度的控制也是至关重要的。然而，在分析高掺杂单晶硅时出现了一个挑战，由于其独特的性质和高掺杂水平，分析这些样品中的氧变得非常困难，杂质和掺杂剂的存在会干扰使用 FT-IR 光谱法对氧浓度的精确测量。

微观金属颗粒的快速分析是工程领域的重要应用（例如发动机磨损分析）。特定碎片的显微XRF扫描和点分析可以获得它们的化学成分。