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Ferroelectric Thin Films Characterization by Spectroscopic Ellipsometry PbZr1-xTixO3 & Ba1-xSrxTiO3
BST thin film deposited onto polished sapphire substrates using Pulsed Laser Deposition (PLD)
Characterization of GeSbTe films by Spectroscopic Ellipsometry for Rewritable Optical Discs
The NIR range contains the most important information to analyze the different GeSbTe structures.


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