DeltaPsi2 is a complete turnkey software package providing advanced measurements, modeling and reporting capabilities. It incorporates numerous functionalities for accurate and flexible characterization of thin film structures and material optical constants.
Last Release March 2016
- Materials library update (dielectrics and metals dispersions and references)
- Kinetic recipes released for easy live data display
- Auto-Soft now available for UVISEL 2 ellipsometer
- Multiwavelength system enhanced for ultra-fast mapping
DeltaPsi2 is able to import ellipsometric data films (via ASCII files) to support modeling and reporting operations of any ellipsometers.
Enhance your existing modeling capabilities or Need an analysis software for thin films?
DeltaPsi2 software is the Good Choice to maximize your application success !