For Flat Panel Display and Photovoltaic Industries
HORIBA Scientific’s large area spectroscopic ellipsometers are designed to provide thin film control solutions in flat panel display and photovoltaic manufacturing.
A large mapping system allows thin film measurements at every location on the panel. Our large area spectroscopic ellipsometers are driven by our DeltaPsi2 software platform, which provides reliable recipes for routine thin film measurements. Automatic recipes fully automate measurement+modelling+mapping+results. Automatic reporting, data reprocessing, import/export package are some of the many functionalities of DeltaPsi2.
HORIBA Scientific’s ellipsometers deliver the highest quality thin film measurements on glass sheets and flexible substrates.
The large area thin film metrology system are designed to fulfill all of your application requirements.
Do you have any questions or requests? Use this form to contact our specialists. * These fields are mandatory.
Customize your instrument
Hybrid Chemical and Video Image Display
A Platform for HORIBA Scientific Ellipsometers
Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer
Emphasize Raman and Optical Images
Confocal Raman Microscope
AFM-Raman for physical and chemical imaging
Raman Microscope
Real-time and Direct Correlative Nanoscopy
LabSpec 6 is a validated software
Camera Endpoint Monitor based on Real Time Laser Interferometry
Automatic Acquisition of Raman Spectra at Multiple Positions
Data analysis for complex data sets
Measure, Indentify, and Classify Particles
Ergonomic software for data acquisition, data treatment and technical support
Fiber coupled microscope
Customize with VBS
Turns Raman Imaging from Hours to Minutes
Password protected user access control
Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm
In-situ spectroscopic ellipsometer for real-time thin film monitoring
X-ray Analytical Microscope Super Large Chamber Model
AFM-Raman for Physical and Chemical imaging
Raman Spectrometer - Confocal Raman Microscope
In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm
In-situ spectroscopic ellipsometer for real-time thin film monitoring