MESA-50K

X-Ray Fluorescence Analyzer

In order to meet RoHS/ELV and to analyze hazardous elements, HORIBA has offered the X-ray Fluorescence Analyzer XGT-1000WR series. Since 2002, 1000 units have been used all over the world for these applications to meet the critical needs from our customers to analyze the sample without cutting it. In 2012, an intuitive MESA-50 X-ray Fluorescence Analyser was released. It became every popular in a very short amount of time, and in 2013 a new type of MESA-50 with a big sample chamber has been added to the MESA-50 series. It is equipped with the sophisticated LN2-free detector. As/Sb analysis function and Multilayer Film FPM are available as options.

Segment: Scientific

Division: X-Ray Fluorescence Spectroscopy

Manufacturing Company: HORIBA, Ltd.

1. Speedy

Silicon Drift Detector (SDD) drastically reduces measurement times, and provides increased sensitivity, for true high throughput analysis.

2. Small

The MESA-50K features a large sized chamber without compromising the minimum footprint. Can be simply connected to PC via USB.

3. Simple

Reduce routine maintenance work (LN₂ free operation)
No need for vacuum pumps
Intuitive simple measurement process for all material types

4. Smart

English / Japanese / Chinese user interfaces
Excel^® data management tool

5. Safe

No worry about X-ray leakage

Options & Consumables

Basic Items	Principle	Energy dispersive X-ray fluorescence spectrometry
	Target application	RoHS, ELV, Halogen Free
	Meas. Elements	13Al - 92U
	Sample type	Solid, Liquid, Powder
X-ray generator	X-ray tube	Max 50kV, 0.2mA
	X-ray irradiation size	1.2mm, 3mm, 7mm (Automatic switching)
	X-ray primary filter	4 types (Automatic switching)
Detector	Type	SDD (Silicon Drift Detector)
Detector	Signal processor	Digital pulse processor
Sample chamber	Atmosphere	Air
	Sample observation	CCD camera
	Chamber size	460 x 360 x 150 mm [W x D x H]
Utility	Operation	PC (Windows^® 7)
Utility	Power supply	100-240V, 50/60Hz
Dimensions		590 x 590 x 400 mm [W x D x H]
Weight		60 kg
Software	Analysis Function	Multilayer Film FPM (Optional), Sb/As analysis (Optional)

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Non-destructive Thickness and Composition Analysis of Coatings on Steel using MESA-50

Steel coating plays an important role in preventing corrosion of steel samples. Therefore, an understanding of coatings can help in improving the steel properties. XRF is a powerful technique for measuring thickness and composition of coatings. We carried out non-destructive thickness and composition analysis of Zinc-Nickel coating on steel using the MESA-50 X-ray fluorescence analyzer.

Solid Waste Combustors and Incinerators in Solid Waste Management and Remediation Services

Micro-XRF analysis for the Electronics Industry

The combination of the XGT-5000’s ground breaking spatial resolution and sensitivity means it is the instrument of choice for fast analysis of electronic components, whether for analysis of restricted harmful elements (the WEEE/RoHS ‘lead free’ legislation), trouble shooting, or R&D.

Micro-XRF analysis for lead contamination in toys

A plastic toy is analysed for the presence of lead within its many components. Spot analysis shows concentrations of this harmful element can reach as high as 0.3%. XRF imaging allows its distribution across the toy to be quickly characterised.

MESA-50K

X-Ray Fluorescence Analyzer

Options & Consumables

Request for Information

Energy Dispersive X-ray Fluorescence

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