MESA-50K

X선 형광 분석기

RoHS/ELV (환경 유해 물질)에 대응하는  X선 형광 분석기 MESA-50 시리즈

2002년부터 전 세계 1000대 이상의 장비가  RoHS/ELV 분석을 위해 샘플을 절단하지 않고 분석해야 했습니다. 이런 기대에 부응하여,  2012년 XGT-1000WR의 후속 모델인  MESA-50 X선 형광 분석기가 출시되었습니다. 출시 후 단기간 안에 판매량이 급증하였으며 2013년에는 MESA-50 시리즈에 큰 샘플 챔버를 갖춘 MESA-50K가 추가되었습니다.
정교한 LN2-free 검출기가 장착되어 있으며, As/Sb 분석 기능과 Multilayer Film FPM의 기능도 추가 가능합니다.

Segment: Scientific
Manufacturing Company: HORIBA, Ltd.

1. Speedy

  • Silicon Drift Detector (SDD) drastically reduces measurement times, and provides increased sensitivity, for true high throughput analysis.

2. Small

  • The MESA-50K features a large sized chamber without compromising the minimum footprint. Can be simply connected to PC via USB.

3. Simple

  • Reduce routine maintenance work (LN2 free operation)
  • No need for vacuum pumps
  • Intuitive simple measurement process for all material types

4. Smart

  • English / Japanese / Chinese user interfaces
  • Excel® data management tool

5. Safe

  • No worry about X-ray leakage

Options & Consumables

Basic Items

 
PrincipleEnergy dispersive X-ray fluorescence spectrometry
Target applicationRoHS, ELV, Halogen Free
Meas. Elements13Al - 92U
Sample typeSolid, Liquid, Powder
X-ray generator

 
X-ray tubeMax 50kV, 0.2mA
X-ray irradiation size1.2mm, 3mm, 7mm (Automatic switching)
X-ray primary filter4 types (Automatic switching) 
Detector
 
TypeSDD (Silicon Drift Detector)
Signal processorDigital pulse processor
Sample chamberAtmosphereAir
Sample observationCCD camera
Chamber size460 x 360 x 150 mm [W x D x H]
UtilityOperationPC (Windows® 7)
Power supply100-240V, 50/60Hz
Dimensions 590 x 590 x 400 mm [W x D x H]
Weight 60 kg
SoftwareAnalysis FunctionMultilayer Film FPM (Optional), Sb/As analysis (Optional)

*Windows is a registered trademark of Microsoft Corporation.

Non-destructive Thickness and Composition Analysis of Coatings on Steel Using MESA-50
Non-destructive Thickness and Composition Analysis of Coatings on Steel Using MESA-50
Steel coating plays an important role in preventing corrosion of steel samples. Therefore, an understanding of coatings can help in improving the steel properties. XRF is a powerful technique for measuring thickness and composition of coatings. We carried out non-destructive thickness and composition analysis of Zinc-Nickel coating on steel using the MESA-50 X-ray fluorescence analyzer.
Solid Waste Combustors and Incinerators in Solid Waste Management and Remediation Services
Solid Waste Combustors and Incinerators in Solid Waste Management and Remediation Services
Micro-XRF analysis for the Electronics Industry
Micro-XRF analysis for the Electronics Industry
The combination of the XGT-5000’s ground breaking spatial resolution and sensitivity means it is the instrument of choice for fast analysis of electronic components, whether for analysis of restricted harmful elements (the WEEE/RoHS ‘lead free’ legislation), trouble shooting, or R&D.
Micro-XRF analysis for lead contamination in toys
Micro-XRF analysis for lead contamination in toys
A plastic toy is analysed for the presence of lead within its many components. Spot analysis shows concentrations of this harmful element can reach as high as 0.3%. XRF imaging allows its distribution across the toy to be quickly characterised.

제품 문의

HORIBA제품의 자세한 정보를 원하시면, 아래의 양식에 내용을 입력을 부탁드립니다.

* 는 필수입력항목입니다.

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