MESA-50

X선 형광 분석기

HORIBA는 고객 요구 사항과 지식에 대한 오랜 경험을 바탕으로 새로운 MESA-50 EDXRF 분석기를 개발했습니다.
MESA-50은 사용자 친화적인 운영 소프트웨어와 우수한 성능을 제공하며, 얇은 케이블을 비롯한 전자 부품에서 벌크한 샘플까지 모든 샘플 분석에 최적인 3가지 분석 직경을 보유하고 있습니다.

MESA-50은 EU RoHS 및 ELV 준수 테스트뿐만 아니라 다른 여러 국가의 규제 사업에 적용됩니다.

Segment: Scientific

Division: X-Ray Fluorescence Spectroscopy

Manufacturing Company: HORIBA, Ltd.

1. Speedy

Silicon Drift Detector (SDD) drastically reduces measurement times, and provides increased sensitivity, for true high throughput analysis.

2. Small

Portable, small footprint and light weight
Internal battery power supply

3. Simple

Reduce routine maintenance work (LN₂ free operation)
No need for vacuum pumps
Intuitive simple measurement process for all material types

4. Smart

English / Japanese / Chinese user interfaces
Excel^® data management tool

5. Safe

No worry about X-ray leakage

Basic Items	Principle	Energy dispersive X-ray fluorescence spectrometry
	Target application	RoHS, ELV, Halogen Free
	Meas. Elements	13Al - 92U
	Sample type	Solid, Liquid, Powder
X-ray generator	X-ray tube	Max 50kV, 0.2mA
	X-ray irradiation size	1.2mm, 3mm, 7mm (Automatic switching)
	X-ray primary filter	4 types (Automatic switching)
Detector	Type	SDD (Silicon Drift Detector)
Detector	Signal processor	Digital pulse processor
Sample chamber	Atmosphere	Air
Sample chamber	Sample observation	CCD camera
Utility	Operation	PC (Windows^® 7)
	Power supply	AC adapter (100-240V, 50/60Hz)
	Power supply	Battery

Non-destructive Thickness and Composition Analysis of Coatings on Steel Using MESA-50

Steel coating plays an important role in preventing corrosion of steel samples. Therefore, an understanding of coatings can help in improving the steel properties. XRF is a powerful technique for measuring thickness and composition of coatings. We carried out non-destructive thickness and composition analysis of Zinc-Nickel coating on steel using the MESA-50 X-ray fluorescence analyzer.

Fast, easy and safe control of Zn-Ni galvanization baths with MESA-50, a portable EDXRF

The EDXRF technique is used for the elemental analysis not only of solids, but also of liquids such as plating solution thanks to dedicated sample cells. This specific example shows the ability of MESA-50 for electrolytic baths follow-up by characterizing the degradation of Zn-Ni galvanization baths.

Solid Waste Combustors and Incinerators in Solid Waste Management and Remediation Services

Micro-XRF analysis for the Electronics Industry

The combination of the XGT-5000’s ground breaking spatial resolution and sensitivity means it is the instrument of choice for fast analysis of electronic components, whether for analysis of restricted harmful elements (the WEEE/RoHS ‘lead free’ legislation), trouble shooting, or R&D.

Micro-XRF analysis for lead contamination in toys

A plastic toy is analysed for the presence of lead within its many components. Spot analysis shows concentrations of this harmful element can reach as high as 0.3%. XRF imaging allows its distribution across the toy to be quickly characterised.

Size: 0.71 MB

MESA-50 catalog

Size: 1.5 MB

How to quantify GDOES depth profile data using XRF

Size: 0.92 MB

Layer thickness and elemental composition determination of metallic coatings: the power of GD-OES & DiP and EDXRF