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Defect / Impurity Monitoring

The photoluminescence method can evaluate the composition, defects, quantum wells, impurities, crystallinity of compound semiconductors in a non-destructive and non-contact manner. In silicon semiconductors, it is used for analyzing trace impurities in silicon.

We can meet a wide range of needs, from basic research to mapping measurements for quality inspections, with our customization capabilities unique to a spectrometer manufacturer.


LabRAM HR Evolution
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Confocal Raman Microscope

LabRAM Soleil
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Raman Microscope

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Add Spectroscopy to ANY Microscope


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