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The Evaluation of Phosphor for White LEDs by CL Image
The SEM and the CL image of phosphor used as white LED.
TFT-LCD Display Characterization Using Spectroscopic Ellipsometry
LCD structure.
Strain Measurements of a Si Cap Layer Deposited on a SiGe Substrate, Determination of Ge Content
Typical structure of Si/SiGe/Si sample.
Spectroscopic Ellipsometry of Compound Semiconductors: AlxGa1-xN / GaN Hetero-Structures
Determination of the thickness and the dispersion of the AlGaN and the GaN layer in the samples of the GaN and AlGaN films deposited on sapphire substrates.
PP-TOFMS Depth Profiling of ZnO Thin Layers Co-doped with Rare Earths for Photonic Materials
Use of Rare Earth Elements (REE).
Plasma Display Panel Characterization Using Spectroscopic Ellipsometry
Plasma Cell Cross Section of a Typical PDP
Optical Characterization of Organic Semiconductors by Spectroscopic Ellipsometry
Thin Film Measurement Capabilities.
OLED – Organic Light Emitting Diodes
OLED Working Principle
Luminescent Defects in Synthetic CVD Diamond Films Localized by Cathodoluminescence Spectroscopy
Fabrication of the diamond micro-pillars
High-k Dielectric with Nanoscale Thickness Studied by Spectroscopic Ellipsometry and FTIR-ATR
High-k Dielectric with Nanoscale Thickness Studied by Spectroscopic Ellipsometry and FTIR-ATR
Encapsulated Organic Light Emitting Diode Devices Characterization by Spectroscopic Ellipsometry
OLED sample description and experimental measurement procedure.
Defect Evaluation of GaN Epitaxial Wafer by CL
The defect density can be evaluated from the intensity image obtained by CL measurement.
Characterization of TFT and LTPS TFT-LCD Display Panels by Spectroscopic Ellipsometry
Characterization of a-Si panels.
Characterization of Organic Light Emitting Diodes (OLED) by Spectroscopic Ellipsometry
Characterization of an OLED sample by Spectroscopic Ellipsometry.
Characterization of LED Thin Film Devices by Spectroscopic Ellipsometry
Image of a packaged deep UV LED

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