The abrasive particles found in CMP slurries have a size distribution which directly affects critical metrics. Particle size analysis is therefore a key indicator of CMP slurry performance. The popularity and utility of several particle sizing techniques will be discussed within.
Measuring PL Upconversion Spectra and Lifetimes of Lanthanide-Doped Nanoparticles
Upconverting lanthanide-based nanomaterials exhibit a unique fluorescence anti-Stokes shift, which enables them to convert NIR wavelength excitation into visible shorter wavelength emissions (NIR to UV-Vis).
Ellipsometric Characterization and Modeling of Different Types of Nanoparticles
UVISEL ellipsometers have been used for the characterization of several systems of nanoparticles. This ellipsometric characterization involves the development of specific modeling tools available within DeltaPsi2 software. Through this report we illustrate the application of ellipsometry to the characterization of nanoparticle based samples. Our goal is to demonstrate that the technique can apply within a large panel of materials science. The HORIBA ellipsometric product line offers the most versatile hardware of the UVISEL series combined with the DeltaPsi2 software including unique modeling features to get the most of your applied work on this fascinating domain of modern physics.
HORIBA Jobin Yvon’s spectrofluorometers have many applications in nanophotonics research: single-walled carbon nanotubes (SWNTs), quantum dots (QDs), and organic light-emitting diodes (OLEDs). Quantum confinement affects nanomaterials’ photoluminescence: when the semiconducting nanoparticle is smaller than the bulk material’s Bohrexciton radius, the bandgap energy is inversely proportional to the nanoparticle size.
Nanophotonics is one of the most exciting new fields to come out of nanotechnology. The quantum-confinement effects observed in these very small (~10 nm) particles can lead to unique optical properties.
Raman Imaging of a Single Gallium Nitride Nanowire: Pushing the Limits of Confocal Microscopy
We have performed a complete Raman polarized study of a single GaN nanowire using a confocal microscope together with a high resolution stage. The high spatial resolution of our Raman confocal instrument together with a piezoelectric stage demonstrates unambiguously the possibility to image the optical properties of nano-objects with a resolution better than 200 nm keeping the fill advantage of the polarization control under a confocal microscope.
HORIBA Jobin Yvon’s NanoLog® spectrofluorometer, specially optimized for recording near-IR fluorescence from nanoparticles, includes a double-grating excitation monochromator, imaging emission spectrograph with a selectable-grating turret, and a variety of detectors.