In-line X-ray fluorescence (XRF) is a non-destructive analytical technique used directly on the production line to measure the elemental composition of materials in real time. By integrating XRF into the process line, manufacturers can achieve consistent quality, improve production efficiency, and respond quickly to variations in coating thickness or composition.
With in-line X-ray fluorescence measurement, you can accurately determine material thickness or element loading in real-time during production, eliminating the need to remove products for time-consuming laboratory analysis.
XRF offers a non-destructive solution. No sample preparation required.
Direct measurement in production line with the In-Line XRF monitor enables 24/7 analysis.
Moreover, the X-ray tube lifetime is approximately 10,000 hours.
Multiple XRF monitors can be installed in each production line with all analysis data shown on one dashboard.
No additional time is required to collect individual analysis data.
HORIBA developed its in-line XRF monitoring especially for continuous roll-to-roll processes (R2R). Monitor and analyze coating processes directly in-line in real-time to ensure the correct material properties. Make use of over 50 years of HORIBA expertise in X-Ray Fluorescence (XRF).
Use cases:
Our in-line XRF monitoring solution is also perfectly suited to be used in battery production – please contact us for more information.
With the XV-100 CCM/MEA Catalyst Coating Monitor, HORIBA offers a solution dedicated specifically to fuel cell and electrolyser applications.
During fuel cell production, even small inaccuracies of used material on the catalyst layer can lead to poor performance of the fuel cell and high costs, as the material of the fuel cell membranes and catalyst ink coating accounts for almost 80% of the total costs of the finished membrane electrode unit. In-line XRF provides real-time data that allows optimizing this production process. Should a layer be deposited too thickly or too thinly, the process can be adjusted immediately.
CCM/MEA Catalyst Coating Monitor
The XRF units come equipped with a microcomputer for stable operation without a PC. Multiple XRF units and also third-party devices (e.g. coaters) can be synchronized and measured. The system can be connected to the customers industrial network by PLC (Programmable Logic Controller) or PC. A touch screen and a PC for maintenance complete the setup.
Key Features:
Our highly pluggable and modular process control software suite facilitates easy integration and customization into production processes. This integration enables dynamic responses, such as automatically rerouting membranes through the coating process when the XRF unit identifies insufficient coating thickness. Benefit from a seamlessly integrated system that enhances efficiency and adaptability in your production environment.
Explore our In-Line XRF Monitoring system with two available sensor types, each offering unique capabilities. For customized versions or detailed specifications, please reach out to our team.
The long working distance (50 mm or more) allows flexible handling even for objects that move up and down. Furthermore, it supports high-speed measurement (minimum of 10 ms) and can be applied to various roll-to-roll processes, including:
Absorption Measurement: By measuring the absorption of primary X-rays, it is possible to measure thick film thicknesses that cannot be measured with the standard type.
Typical applications are:
For comprehensive details and demonstrations of each model, please don't hesitate to contact us. We are ready to provide tailored solutions that meet your specific needs.
Principle | X-ray fluorescence Analysis |
Detector | Silicon drift detector |
X-ray tube target element | Rh, W, Ag |
X-ray voltage | 15 – 50 KV |
X-ray tube current | 4 – 200 μA |
Working distance | 5 – 150 mm (as standard) |
Measurement period | 10 ms – 10 min |
Data interface | MODBUS® TCP, OPC UATM |
*MODBUS is a registered trademark of Schneider Electric USA Inc. OPC UA is a trademark of OPC Foundation. Other interfaces (EtherCAT, Profinet, etc.) are available through customization.
Do you have any questions or requests? Use this form to contact our specialists.
In-line X-ray fluorescence (XRF) is a non-destructive analytical technique used directly on the production line to measure the elemental composition of materials in real time. By integrating XRF into the process line, manufacturers can achieve consistent quality, improve production efficiency, and respond quickly to variations in coating thickness or composition.