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i-CLUE

Cathodoluminescence i CLUE MM Picture Fr

Fast Imaging Cathodoluminescence

The i-CLUE offers the highest performance Cathodoluminescence Imaging. 

The fastest and easiest way to collect CL images providing a powerful structural analysis of your sample at the nanoscale.

Based on optical fiber modular design, i-CLUE is the corner stone solution that can be upgraded later in the field to F-CLUE full hyperspectral CL analysis system.

Thanks to the performance of high numerical aperture and low roughness collection mirror coupled to an optimized acquisition chain and detection, i-CLUE  offers up to 10 times higher sensitivity compared to standard CL imaging solutions.

Featuring a compact and fully retractable interface, i-CLUE offers a convenient solution which can be fully integrated in most commercial electron microscopes while maintaining their original configuration.

The CL imaging scanning and processing being fully controlled by the Electron Microscope software, its usability is straightforward for the SEM specialist.

 

事業セグメント: 科学
製造会社: HORIBA France SAS

best price-to-performance ratio for a plug-and-play fast CL imaging module features:

  • Ultra-compact panchromatic CL detection
  • Manually retractable mirror
  • large field of view ellipsoidal mirror collection
  • Driven by EM software
  • Imaging touch-screen control

Spectral Range

Panchromatic CL

Diamond turned collection mirror

ellipsoidal mirror
short & long working distances

200 mm retractable interface

Manual fine adjustment under vacuum

CL imaging detector

Panchromatic CL with ambient PMT

CL spectrometer type

N/A option upgrade to F-CLUE-e

Upgrade available

Upgrade to F-CLUE-e

Electron beam control

SEM software

Software

SEM software

Remote Controller

included

Clue Accessories

N/A

SEM Accessories

N/A

 

Defect Evaluation of GaN Epitaxial Wafer by CL
Defect Evaluation of GaN Epitaxial Wafer by CL
The threading dislocation occurs easily in GaN crystal grown on sapphire substrates. It is said that this is caused by the large lattice mismatch of sapphire and GaN. The crystal may seem to be uniform in the SEM image, but the dark spot such as the threading dislocation can be observed when measuring the CL intensity image at the wavelength (362nm) which corresponds to the band edge emission.
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Luminescent Defects in Synthetic CVD Diamond Films Localized by Cathodoluminescence Spectroscopy
Luminescent Defects in Synthetic CVD Diamond Films Localized by Cathodoluminescence Spectroscopy
The characterization of synthetic CVD diamond material by hyperspectral cathodoluminescence spectroscopy and imaging allows the detection and accurate location of the promising NV luminescent point defects for innovative solid-state quantum mechanical systems. In this work we performed CVD epitaxial growth on a pattern of micro-pillars etched on a diamond substrate. Cathodoluminescence (CL) analysis revealed that NV centres were successfully localized at the edges of the pillars.
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The Evaluation of Phosphor for White LEDs by CL Image
The Evaluation of Phosphor for White LEDs by CL Image
Phosphor plays a key role to obtain white light as for blue LED + phosphor and near ultraviolet LED + phosphors. In order to improve high bright white LEDs, it is necessary that the whole phosphor particle emits light homogeneously. When measuring with CL the phosphor used as white LED, the area which does not emit light in phosphor particle can be observed. CL system is used for evaluation of non-luminescent area to improve luminescent efficiency and characteristics.
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