Spectroscopic ellipsometry is a powerful, non-destructive optical technique used primarily to determine thin film thickness and optical constants for a wide range of materials from many different application fields. This webinar will focus specifically on applications of spectroscopic ellipsometry in the field of organic electronics. Examples of spectroscopic ellipsometry applied to organic light emitting diodes (OLED), polymer blend materials (PCBM/P3HT), and organic polymers for the study of polymer light emitting diodes (e.g. Super yellow for PLED applications) will be presented. In all of these cases, thickness and optical constant determination and control is critical for optimum device performance, so spectroscopic ellipsometry provides much needed information without damaging the samples being measured.