Plasma Profiling TOFMS
Coatings on glass
Si3N4 /NiCr/Ag/ZnO/Si3N4 glass
- A.C. Muñiz, J. Pisonero, L. Lobo, C. Gonzalez, N. Bordel, R. Pereiro, A. Tempez, P. Chapon, N. Tuccitto, A. Licciardello and A. Sanz-Medel “Pulsed radiofrequency glow discharge time-of-flight mass spectrometer for the direct analysis of bulk and thin coated glasses” Journal of Analytical Atomic Spectrometry, 23, 1239–1246 (2008). DOI: 10.1039/B804169P
- Example of depth profile of anodized Tantalum deposited on glass substrate (Sample from University of Manchester).
