Optical Characterization of CIGS by Spectroscopic Ellipsometry
Spectroscopic Ellipsometry is an efficient and non-destructive method for extracting optical constants of materials in the UV-VIS-NIR wavelength ranges. The optical constants (n,k) of a material are among the most important sets of optical data and are specific to the material being studied.
During this webinar, you will learn how to define a strategy to perform quantitative Spectroscopic Ellipsometry on CIGS semiconducting thin films. CIGS is among the most efficient absorbers for photovoltaic solar conversion. Deployed as thin or ultra thin films, CIGS optical characterization is as important in its preparation stage as in the modeling of cell stacks. However the determination of CIGS optical constants is a very complex challenge, particularly for SE when it is used as a unique and direct experimental method.
Photoluminescence spectroscopy (PL) is a powerful optical method used for characterizing materials. PL can be used to find impurities and defects in silicon and group III-V element semiconductors, and to determine semiconductor band-gaps.
High-Resolution Low-Temperature PL of Semiconductors
Temperature-dependent photoluminescence (PL) spectroscopy is a powerful optical method for
characterizing materials. PL can be used to identify defects and impurities in Si and III-V semiconductors, as well as determine semiconductor bandgaps. At room temperature, PL emission is usually broad—up to 100 nm in width.
As a result of rapid development in semiconductor manufacturing, many types of optoelectronic
devices such as laser diodes, LEDs, and high-electron-mobility transistors (HEMTs) are now fabricated by epitaxial-growth methods.
Gallium Nitride (GaN) is one of a generation of promising light-emitting materials. Its direct energy band gap of ~3.4 eV at room temperature make it particularly suitable for emission in the blue, and near UV spectral ranges. The material often exhibits high temperature stability and low electrical leakage, and hence GaN is generally a good candidate for fabricating high-temperature and high-power devices.
Characterization of Semiconductors with Photoluminescence Measurement System
Photoluminescence is the optical emission obtained by photon excitation (usually a laser) and is commonly observed with III-V semiconductor materials. This type of analysis allows non-destructive characterization of semiconductors (material composition, qualitative investigations, etc.
III-V Wafer Characterization through Photoluminescence Mapping
III-V semiconductors are important to the fabrication of active photonic devices such as light sources and detectors. Successful fabrication of such devices relies on the high quality of the underlying materials and precise deposition of intended geometries on a wafer substrate.
Room-temperature Micro-electroluminescent Characterization of Ge-based IR Sources
Monolithic integration of optical components on CMOS platforms is ongoing in the optical communications industry. CMOS offers a mature and robust platform, and therefore is logical for building optical-interconnect modules.
Measurement of carrier lifetime in perovskite for solar cell applications
Hybrid perovskite photovoltaics (PV) show promise because of their good efficiencies, which can be
around 20%. Along with their PV characteristics, perovskite materials exhibit a high degree of radiative recombination.
Applications that involve photoluminescence (PL) measurements in NIR have been rapidly growing
in recent years. The demand comes mainly from several areas in materials science, such as fiber optics telecommunication, solar energy conversion, lasing media, LED and OLED technologies, and development of upconversion nanoparticles for biomedical analyses and bioimaging.
One of the fastest-growing segments of the semiconductor industry is concerned with a new
generation of graphic displays for communications and high-definition television sets. For
phosphors that might be used as the active medium in such displays, the critical characteristics
are the lifetimes and wavelengths of their emissions.
Evaluation of Novel Photoresponsive Materials via EQE Measurements
Internal Quantum Efficiency (IQE) and External Quantum Efficiency (EQE) measurements are indicators of the effectiveness of a photosensitive device such as those used in telecommunications and solar cells. EQE is the ratio of the charges generated to the total amount of photons incident on the surface; a larger EQE indicates a more efficient device.
Characterizing Lanthanides in Glasses for Optical Applications
Glasses are essential materials with a multitude of uses and many forms. In the area of optoelectronics there is an interest to modify the glass composition to favor the incorporation of lanthanide elements.
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