H-CLUE

Cathodoluminescence H CLUE MM Picture Fr

Versatile Hyperspectral Cathodoluminescence

The H-CLUE direct coupled solution offers the ultimate performance for Cathodoluminescence Imaging and Spectroscopy analysis.

Embedding field-proven optical components of HORIBA Scientific, H-CLUE overcomes its competition in terms of sensitivity over wide spectral ranges from FUV to extended NIR.

Modularity and versatility are highlighted by the game-changing OptiLink module placed between the retractable mirror interface and the spectrometer and offering any other possibility of CL imaging such like polarized CL, RGB CL, Angular Resolved CL (AR-CL) and Time Resolved CL (TR-CL).

Controlled by Labspec 6 Simply Powerful software suite, H-CLUE features advanced unique functionalities for both fast imaging and spectroscopy analysis (KIA spectral database, SWIFT, cosmic ray removal, peak fitting, particle finder, mosaic, multivariate analysis, advanced 3D display…)

Segment: Scientific
Division: Molecular and Microanalysis
Manufacturing Company: HORIBA France SAS

Free space optical coupling for the highest performance over the widest CL spectral range

  • Fully automated control
  • Motorized RPM with fine adjustment
  • No chromatic shift
  • Customized configurations: angle-resolved  CL, time-resolved CL, polarization, filter wheels
  • Imaging and spectroscopy from DUV to NIR with up to 5 detectors
  • Long focal length spectrometers

Spectral Range

UV - VIS - NIR
Free space achromatic coupling

Diamond turned collection mirror

parabolic mirror
short & long working distances

200 mm retractable interface

Motorized with fine adjustment under vacuum

CL imaging detector

Standard: Panchromatic and monochromatic CL with ambient PMT
Options: Cooled PMT, IGA monochannel, photon counting PMT, time resolved PMT, RGB filters

CL spectrometer type

iHR 320, iHR 550 (320 to 550 mm focal length),up to 3 grating turret, 2-entrance/2exit

Upgrade available

Upgrade from PL, MicOS systems

Electron beam control

CL-LINK for multiple acquisition processing (Analog, pulse mode, SE), Mapping linescan,
point measurement, Synchronization with spectroscopic detection, Control by external scan input of Electron Microscope

Software

Spectroscopy and imaging powered by LabSpec 6™

Remote Controller

Optional

Clue Accessories

Polarization, ND filter, camera, EMCCD etc

SEM Accessories

LN2, He cryo-stages, EBIC detector and many other accessories to complement our CLUE Series add-on detectors

Luminescent Defects in Synthetic CVD Diamond Films Localized by Cathodoluminescence Spectroscopy
Luminescent Defects in Synthetic CVD Diamond Films Localized by Cathodoluminescence Spectroscopy
The characterization of synthetic CVD diamond material by hyperspectral cathodoluminescence spectroscopy and imaging allows the detection and accurate location of the promising NV luminescent point defects for innovative solid-state quantum mechanical systems. In this work we performed CVD epitaxial growth on a pattern of micro-pillars etched on a diamond substrate. Cathodoluminescence (CL) analysis revealed that NV centres were successfully localized at the edges of the pillars.
The Evaluation of Phosphor for White LEDs by CL Image
The Evaluation of Phosphor for White LEDs by CL Image
Phosphor plays a key role to obtain white light as for blue LED + phosphor and near ultraviolet LED + phosphors. In order to improve high bright white LEDs, it is necessary that the whole phosphor particle emits light homogeneously. When measuring with CL the phosphor used as white LED, the area which does not emit light in phosphor particle can be observed. CL system is used for evaluation of non-luminescent area to improve luminescent efficiency and characteristics.
Defect Evaluation of GaN Epitaxial Wafer by CL
Defect Evaluation of GaN Epitaxial Wafer by CL
The threading dislocation occurs easily in GaN crystal grown on sapphire substrates. It is said that this is caused by the large lattice mismatch of sapphire and GaN. The crystal may seem to be uniform in the SEM image, but the dark spot such as the threading dislocation can be observed when measuring the CL intensity image at the wavelength (362nm) which corresponds to the band edge emission.

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