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Surface Characterization

Surface characterization instruments measure physical, mechanical and chemical parameters of an interface such as thin films and coatings. These instruments are used to measure optical properties, film thickness, composition, morphology and other parameters related to surface analysis.

HORIBA provides a wide range of surface characterization instruments including:


These instruments are used over a broad range of market such as:

  • Material Sciences for nanomaterials, graphene, quantum dots
  • Semiconductor for display technology, light emitting diodes, data storage
  • Energy for battery, photovoltaics cells

Spectroscopic Ellipsometers

Glow Discharge Optical Emission Spectrometers

Plasma Profiling Time-Of-Flight Mass Spectrometers



Atomic Force Microscopes

Raman Spectrometers

Browse Products

Auto SE
En savoir plus Auto SE

Spectroscopic Ellipsometer for Simple Thin Film Measurement

En savoir plus CombiScope

AFM and inverted light microscopy

GD-Profiler 2™
En savoir plus GD-Profiler 2™

Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer

HE Spectrograph
En savoir plus HE Spectrograph

High efficiency dedicated process Raman spectrometer for rugged and robust Raman monitoring.

LabRAM Nano
En savoir plus LabRAM Nano

AFM-Raman for physical and chemical imaging

LabRAM Odyssey
En savoir plus LabRAM Odyssey

Best-in-class Raman Imaging & High Resolution Spectrometer

LabRAM Soleil Nano
En savoir plus LabRAM Soleil Nano

Real-time and Direct Correlative Nanoscopy

En savoir plus MacroRAM™

Affordable Benchtop Raman Spectrometer

En savoir plus OmegaScope

The AFM optical platform

Plasma Profiling TOFMS
En savoir plus Plasma Profiling TOFMS

Ultra-Fast, Sensitive and High Resolution Depth Profiling technique

En savoir plus ProteusQ

Scanning NV Magnetometry

Smart SE
En savoir plus Smart SE

Powerful and Cost Effective Spectroscopic Ellipsometer

En savoir plus SmartSPM

Advanced stand-alone AFM

Spectroscopic Ellipsometer - In-Line
En savoir plus Spectroscopic Ellipsometer - In-Line

In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems

UV Raman Spectrometer
En savoir plus UV Raman Spectrometer

for UV Raman spectroscopists

En savoir plus UVISEL 2 VUV

A versatile spectroscopic ellipsometer covering a large range from VUV to NIR

En savoir plus UVISEL Plus

Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm

UVISEL Plus In-Situ
En savoir plus UVISEL Plus In-Situ

In-situ spectroscopic ellipsometer for real-time thin film monitoring

En savoir plus XploRA INV

Inverted Raman Microscope

XploRA Nano
En savoir plus XploRA Nano

AFM-Raman for Physical and Chemical imaging

En savoir plus XploRA™ PLUS

Raman Spectrometer - Confocal Raman Microscope