AFM-Raman (co-localized measurements & TERS)

AFM-Raman and Nano-Raman

Physical and Chemical imaging

HORIBA's leading Raman technology is now integrated with AIST-NT’s scanning probe microscopy (SPM). The NanoRamanTM platform integrates Atomic Force Microscopy (AFM) that can provide physical sample information on the nanometer scale, including topography, hardness, adhesion, friction, surface potential, electrical and thermal conductivity, temperature and piezo response (among many others), near-field optical techniques (SNOM or NSOM), Scanning Tunneling Microscopy (STM), tuning fork techniques (Shear-force and Normal-force imaging modes), electrochemistry, all together with the chemical information obtained from Raman spectroscopy and Photoluminescence. The end result is a more comprehensive sample characterization in one versatile instrument, for fast simultaneous co-localized measurements, Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL).HORIBA's leading Raman technology is now integrated with AIST-NT’s scanning probe microscopy (SPM). The NanoRamanTM platform integrates Atomic Force Microscopy (AFM) that can provide physical sample information on the nanometer scale, including topography, hardness, adhesion, friction, surface potential, electrical and thermal conductivity, temperature and piezo response (among many others), near-field optical techniques (SNOM or NSOM), Scanning Tunneling Microscopy (STM), tuning fork techniques (Shear-force and Normal-force imaging modes), electrochemistry, all together with the chemical information obtained from Raman spectroscopy and Photoluminescence. The end result is a more comprehensive sample characterization in one versatile instrument, for fast simultaneous co-localized measurements, Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL).

Browse Products

LabRAM HR Evo Nano
MoreAFM-Raman LabRAM HR Nano
Physical and Chemical imaging on a single platform
AFM-Raman XploRA Nano
MoreAFM-Raman XploRA Nano
Physical and Chemical imaging on a single platform