AFM-Raman (co-localized measurements & TERS)

Physical and Chemical imaging

HORIBA's leading Raman technology is now integrated with AIST-NT’s scanning probe microscopy (SPM). The NanoRamanTM platform integrates Atomic Force Microscopy (AFM) that can provide physical sample information on the nanometer scale, including topography, hardness, adhesion, friction, surface potential, electrical and thermal conductivity, temperature and piezo response (among many others), near-field optical techniques (SNOM or NSOM), Scanning Tunneling Microscopy (STM), tuning fork techniques (Shear-force and Normal-force imaging modes), electrochemistry, all together with the chemical information obtained from Raman spectroscopy and Photoluminescence. The end result is a more comprehensive sample characterization in one versatile instrument, for fast simultaneous co-localized measurements, Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL).

Creating high scientific impact

In situ topographical chemical and electrical imaging of carboxyl graphene oxide at the nanoscale

The multi-parameter measurement methodology proposed in this paper greatly extends the capability of TERS allowing a direct correlation of local topography, chemical composition and electronic properties at the nanoscale here applied on carboxyl-modified graphene oxide.

 

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Probing the Nanoscale Light Emission Properties of CVD-grown MoS2 Monolayer by Tip-enhanced Photoluminescence

AFM, TERS and TEPL are performed simultaneously and showed that the variation of the light emission properties is due to different effects depending on the shape of the MoS2 single layer, the concentration of point defect and the presence of nanoscale terrace in triangular monolayer.

 

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Tip-Enhanced Raman Scattering from Nanopatterned Graphene and Graphene Oxide

1D and 2D patterns were successfully imprinted in flakes of single-layer graphene and graphene oxide by means of pulsed-force nanolithography using a single-crystal diamond AFM probe. The resulting patterns demonstrated dramatically-increased TERS activity compared to flat non-patterned areas.

 

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Nanoscale Heterogeneities in Monolayer MoSe2 Revealed by Correlated Scanning Probe Microscopy and Tip-Enhanced Raman Spectroscopy

TERS is used for the first time on synthetic MoSe2 monolayers, combined with other SPM techniques, all with sub-20 nm spatial resolution. Nanoscale heterogeneities in the Raman spectra of MoSe2 are uncovered and the presence of nanoscale domains of MoO3 in the 2D flakes is revealed.

 

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Nanoscale doping heterogeneity in few-layer WSe2 exfoliated onto noble metals revealed by correlated SPM and TERS imaging

Correlations between surface potential, resonant Tip-Enhanced Raman signatures and photocurrents indicates the presence of inhomogeneities within interfacial electronic properties, which are attributed to variations in the local doping of the WSe2.

 

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Transport mechanisms in a puckered graphene-on-lattice

TERS is applied on suspended graphene monolayer on SiO2 nanopillar arrays for the investigated the local strain at the nanoscale. TERS measurements revealed a small strain varations with higher value at the location of the pillars.

 

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Nanoscale chemical imaging of solid–liquid interfaces using tip-enhanced Raman spectroscopy

The authors demonstrate label-free and non-destructive molecular imaging in a liquid environment at the nanoscale thanks to Tip-Enhanced Raman spectroscopy (TERS). This extends the scope of TERS to a range of scientific disciplines in which nanostructured solid–liquid interfaces play a key role.

 

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Giant Gap-plasmon Tip-Enhanced Raman Scattering of MoS2 Monolayers on Au Nanocluster Arrays

Giant Raman enhancement of MoS2 monolayer located in a plasmonic gap between the Au TERS tip and Au nanoclusters is reported. An unprecedented TERS enhancement factor of 5.6 x 108 and a spatial resolution as small as 2.3 nm at ambient conditions are reported.

 

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Highly Localized Strain in a MoS2/Au Heterostructure Revealed by Tip-Enhanced Raman Spectroscopy

TERS is used to determine the local biaxial strain in ultrathin MoS2 flake with changes spatially localized to regions as small as 25 nm. This study shows how TERS can determine the built-in strain that arises when 2D materials interact with other nanostructures.

 

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Complex Electron Transfer Pathway at a Microelectrode Captured by in Situ Nanospectroscopy

The study demonstrates that a TERS tip can be functionalized and partially insulated to be used as a microelectrode enabling electrochemical enhanced Raman spectroscopy at a single hotspot. This work opens new perspectives in the characterization and development of complex redox architectures for molecular devices.

 

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Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale

Simultaneous topographical, chemical, optical and electrical measurements at the nanoscale are applied to the optimisation of organic solar-cells developed. This work clearly pushes the boundaries of nanoscale surface characterisation using TERS.

 

 

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Customers testimonials

A fully automated system

”With our NanoRaman instrument from HORIBA, we have the full power of Raman, AFM, TERS, TEPL, and many other related modes bundled into one system operating in reflection. Every member of my group from bachelor student level to postdoc researcher enjoys the easy usage of this fully motorized/automated system that can deliver correlated surface characterization data from microscale down to nanoscale resolution. We are using this AFM/Raman platform for research on optical and electrical properties of nanomaterials every day and we are appreciating the enormous potential of the TERS techniquefor studying nanomaterials such as CNTs and 2D TMDCs with unprecedent spatial resolution down to 2 nm.”

 

A stable and versatile solution

"We are using the NanoRaman platform from HORIBA Scientific for research on carbon-based nanomaterials and especially the characterization of graphene oxide for energy applications. This AFM/Raman system is easy-to-use with help of the state-of-art hot spot search function and has number of unique build-in SPM techniques, including a unique imaging mode that makes TERS possible. HORIBA (and former AIST-NT) has developed one of the most stable and versatile scanning probe microscope for the combination with Raman spectroscopy. With the clever, fully motorized and automated instrument alignment, every advanced measurement at the nanoscale become an easy to configure experiment."

 

Great technical support

“We have been working for two years on a versatile configuration of the NanoRaman platform from HORIBA that allows both reflection and transmission measurements. As researchers in an electrochemistry Lab, we were searching for analytical tools which enable the characterization of materials at the nanoscale and under the condition of their operation. The stability of the SPM system (true atomic/molecular resolution) and the robustness of the optical coupling, which enables fast and effective TERS mappings, totally met our expectations. The versatility of the Horiba system already made possible new characterization pathways such as TERS in liquid and electrochemical TERS. We have also greatly enjoyed the technical assistance from Horiba which has definitively boosted our instrumental developments”.

 

A pioneer in TERS

“The nano-Raman team of LPICM lab, Ecole Polytechnique, developed jointly with HORIBA Scientific the first HORIBA TERS system prototype a dozen or so years ago. Later commercialized, the prototype featured STM and AFM SPM modes combined with side illumination in Raman backscattering configuration. Owing to its excellent performance and relative ease of use, it was applied with success to the study of various materials and nanostructures such as self-assembled organic monolayers, carbon nanotubes, patterned semiconductors, etc. Among the outstanding scientific successes achieved with the system, the world premiere demonstration of stimulated (pump - probe) TERS is to be mentioned. Being quite user-open and versatile, the prototype measurement configuration could be successfully adapted to accommodate a polarization control of both excitation and scattered radiations, an external laser pump, as well as an additional detector for Tip-Enhanced Photoluminescence.

Since the pioneering years of the TERS prototype, HORIBA Scientific have developed a novel, module-based TERS system featuring a large number of SPM modes (STM, AFM, tuning-fork, etc.) implementable under various illumination – collection conditions (off-axis, top and bottom backscattering). Thanks to the customer-oriented culture of HORIBA, the nano-Raman team of LPICM is currently updating its “historical” prototype with the novel TERS system. It will allow us not only to pursue our actual research topics by adding new measurements, but also to initiate new research areas, impossible to address with the present system.”

AFM-Raman

AFM-Raman (co-localized measurements & TERS)

TERS brings Raman Spectroscopy into nanoscale resolution imaging. Learn more about this super-resolution chemical imaging technique.

 

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