Rendering of an in-line XRF roll-to-roll application.

In-Line XRF Monitoring

Real-time XRF analysis and control for roll-to-roll coating processes

HORIBA developed its in-line XRF monitoring especially for continuous roll-to-roll processes (R2R). Monitor and analyze coating processes directly in-line in real-time to ensure the correct material properties. Make use of over 50 years of HORIBA expertise in X-Ray Fluorescence (XRF)!

Key Features:

Seamless Integration: Designed for easy integration into roll-to-roll processes, complete with X-ray protection measures.
Modular Software: Highly connective and modular software facilitates in-line process monitoring.
Compatibility: Compatible with standard communication protocols for streamlined integration into existing systems.

With in-line X-ray fluorescence measurement, you can accurately determine material thickness or element loading in real-time during production, eliminating the need to remove products for time-consuming laboratory analysis.

The dedicated process software, with support of standard communication protocols, enables the introduction of real-time quality control in various industrial processes. This not only leads to cost savings by reducing rejects but also minimizes material usage, particularly for precious metals like platinum or iridium. Moreover, it contributes to sustainable production by conserving resources, ultimately enhancing overall production efficiency.

In-line XRF technology detects concentrations ranging from 100 percent down to the parts per million (ppm) range, and in some cases, even down to the sub-ppm range. Upgrade your coating processes with precise, real-time monitoring for improved quality, efficiency, and sustainability.

Measurement of the catalyst layer and the proton exchange membrane with in-line XRF analysis.

HORIBA's in-line XRF monitoring solution distinguishes between the catalyst layer (CL) and the proton exchange membrane (PEM). Therefore, the graph only shows the thickness of the platinum catalyst layer and not the proton exchange membrane.

In-Line XRF for Fuel Cell Production

While the in-line XRF technology can be applied in many industries, HORIBA offers a solution dedicated specifically to fuel cell and electrolyser applications.

During fuel cell production, even small inaccuracies of used material on the catalyst layer can lead to poor performance of the fuel cell and high costs, as the material of the fuel cell membranes and catalyst ink coating accounts for almost 80% of the total costs of the finished membrane electrode unit. In-line XRF provides real-time data that allows optimizing this production process. Should a layer be deposited too thickly or too thinly, the process can be adjusted immediately.

Your advantages:

Cost Savings: Optimize the use of precious metals, such as platinum and iridium, to maximize cost efficiency.
Waste Reduction: Identify and address defects and inconsistencies early in the production process, minimizing material waste.
Enhanced Traceability: Collect XRF data for each batch or roll of material, ensuring better traceability in the event of defects or issues in the field.

Choose HORIBA's In-Line XRF for fuel cell production to achieve cost-effective, precise, and environmentally conscious manufacturing.

Other Applications for In-Line XRF

Coating amount of platinum catalyst in Catalyst Coated Membrane (CCM)
Multi-layer ceramic capacitor (MLCC) Ni electrode film thickness
Additive element concentration in steel
Thickness of anti-corrosion film on metal film
Metal thickness of heat sink material

Our in-line XRF monitoring solution is also perfectly suited to be used in battery production – please contact us for more information!

Example setup for an integrated in-line XRF system.

System Integration

The XRF units come equipped with a microcomputer for stable operation without a PC. Multiple XRF units and also third-party devices (e.g. coaters) can be synchronized and measured. The system can be connected to the customers industrial network by PLC (Programmable Logic Computer) or PC. A touch screen and a PC for maintenance complete the setup.

Key Features:

Flexible Connectivity: Easily connect the system to your industrial network via Programmable Logic Computer (PLC) or PC.
Expandable System: Integrate multiple devices, including X-ray units and devices from other manufacturers like coaters.
Stable Operation: The inclusion of a microcomputer ensures stable system operation without a PC.

Software

Our highly pluggable and modular process control software suite facilitates easy integration and customization into production processes. This integration enables dynamic responses, such as automatically rerouting membranes through the coating process when the XRF unit identifies insufficient coating thickness. Benefit from a seamlessly integrated system that enhances efficiency and adaptability in your production environment.

Technical Specifications

Explore our In-Line XRF Monitoring system with two available sensor types, each offering unique capabilities. For customized versions or detailed specifications, please reach out to our team.

Standard Sensor Type

The long working distance (50 mm or more) allows flexible handling even for objects that move up and down. Furthermore, it supports high-speed measurement (minimum of 5 ms) and can be applied to various roll-to-roll processes, including:

Metal thickness on film
Thickness of Lithium-ion battery sheets (LIB)
Adhesion amount of fuel cell catalyst
Component concentration in steel material

Transmission Sensor Type

Absorption Measurement: By measuring the absorption of primary X-rays, it is possible to measure thick film thicknesses that cannot be measured with the standard type.

Typical applications are:

Metal film thickness of heat sink material, e.g. Silver (Ag) 150 µm or more
Thickness of a porous metal sheet
Thickness of power device heat sink

For comprehensive details and demonstrations of each model, please don't hesitate to contact us. We are ready to provide tailored solutions that meet your specific needs.

Principle	X-ray fluorescence Analysis
Detector	Silicon drift detector
X-ray tube target element	Rh, W, Ag
X-ray voltage	15 – 50 KV
X-ray tube current	4 – 200 μA
Working distance	5 – 150 mm (as standard)
Measurement period	10 ms – 10 min
Data interface	Modbus™ TCP, EtherCAT^®, ...