Plasma Profiling TOFMS

PP-TOFMS-HORIBA

Ultra-Fast, Sensitive and High Resolution Depth Profiling technique

 

Ultra-Fast, Sensitive and High Resolution Depth Profiling technique

The new Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of almost any material. The speed and ease of use of PP-TOFMS aims at reducing the optimization time of growth processes as many research scientists strive to reduce the time from discovery to applications of new materials.

The simultaneous full coverage of TOFMS available for each point of depth permits the detection of non suspected contamination. This is key for failure analysis and optimization of thin film processes that tend to no longer be based on ultra-high grade methods (i.e. ink jet printing…).

PP-TOFMS will be the ideal close-to-process tool for materials scientists:

  • To check on stoichiometry versus depth of layers ranging from nm to tens of microns
  • To determine doping depth distribution
  • Identify unsuspected contamination
  • Monitor interface composition and width
Segment: Scientific
Division: Elemental Analysis
Base product
Manufacturing Company: HORIBA France SAS

PP-TOFMS instrument is

  • Compact
  • Rapid
  • Easy to get hands on
  • General application in materials science
  • Multi-user

 

 

 

  • Glow discharge Plasma Source
  • Unique patented RF pulsing mode
  • No sample preparation, no sample transfer in UHV environment
  • Easy (flat Horizontal) and ergonomic sample positioning with laser help
  • High sample tolerance size from 0.7 cm to 30 cm
  • Standard 4 mm anode for 4 mm diameter crater
  • Available 2mm anode for 2 mm diameter crater
  • Oil free environment (Dry pump)
  • Easy removal and cleaning of source parts

 

TOF analyzer

  • Orthogonal extraction
  • High resolution reflectron (resolving power up to 5000 at 208 Th)
  • User friendly, ergonomic, fast hands on
  • Possibility to attenuate for four intense ions for high dynamics: user choice of ions and attenuation amplitude

 

Software

  • Fast automatic starting procedures
  • Real time display of depth profiles
  • One click semi-quantitative depth profile
  • Remote online capability
Battery Evaluation in Electrical Equipment
Battery Evaluation in Electrical Equipment
PP-TOFMS Depth Profiling of ZnO Thin Layers Co-doped with Rare Earths for Photonic Materials
PP-TOFMS Depth Profiling of ZnO Thin Layers Co-doped with Rare Earths for Photonic Materials
PP-TOFMS is a fast and reliable technique for depth profiling of rare earth doped ZnO thin films. Tb and Eu profiles are obtained with high sensitivity and high depth resolution. This type of information is typically provided by SIMS, RBS or depth profiling XPS but not as rapidly and readily and at a higher cost. Such profiles turn out to be powerful complementary information to understand photoluminescence data. This example extends to similar materials for photonics (lighting, display, solar energy industries) applications such as other wide bandgap semiconductors (SiC, GaN...), nitrides and oxynitrides layers, silicon nano-objects, glasses... doped with Yb, Y, Sm, Er, Nd, Pr, and Tm...
PP-TOFMS Brochure
CategoryDocuments
Size 13.82 MB
FiletypePDF

REQUEST FOR INFORMATION

Do you have any questions or requests? Use this form to contact our specialists.

Product accessories

PP-TOFMS Software
MorePP-TOFMS Software
Egonomic software for data acquisition, data treatment and technical support

Related products

EMGA-920
MoreEMGA-920
Oxygen/Nitrogen Analyzer
EMGA-921
MoreEMGA-921
Hydrogen Analyzer
EMGA-930
MoreEMGA-930
Oxygen/Nitrogen/Hydrogen Analyzer
EMIA-Expert
MoreEMIA-Expert
Carbon/Sulfur Analyzer
EMIA-Pro
MoreEMIA-Pro
Carbon/Sulfur Analyzer
EMIA-Step
MoreEMIA-Step
Carbon/Sulfur Analyzer
GDOES Software
MoreGDOES Software
Quantum and Image
Glow Discharge Optical Emission Spectrometer - GD-Profiler 2™
MoreGlow Discharge Optical Emission Spectrometer - GD-Profiler 2™
Discover a Whole New World of Information
IG-320
MoreIG-320
Gloss Checker
IG-331
MoreIG-331
Gloss Checker
IG-410
MoreIG-410
High Gloss Meter
MESA-50
MoreMESA-50
X-Ray Fluorescence Analyzer
MESA-50K
MoreMESA-50K
X-Ray Fluorescence Analyzer
Partica LA-960
MorePartica LA-960
Laser Scattering Particle Size Distribution Analyzer
Raman Spectrometer - LabRAM HR Evolution
MoreRaman Spectrometer - LabRAM HR Evolution
Confocal Raman Microscope
Raman Spectrometer - XploRA ONE™
MoreRaman Spectrometer - XploRA ONE™
Simply better Raman
Raman Spectrometer - XploRA™ PLUS
MoreRaman Spectrometer - XploRA™ PLUS
Confocal Raman Microscope
Smart SE
MoreSmart SE
Powerful and Cost Effective Spectroscopic Ellipsometer
Spectroscopic Ellipsometer - Auto SE
MoreSpectroscopic Ellipsometer - Auto SE
Simple Thin Film Measurement Tool!
Spectroscopic Ellipsometer - UVISEL Plus
MoreSpectroscopic Ellipsometer - UVISEL Plus
FUV to NIR: 190 to 2100 nm
Spectroscopic Ellipsometer UVISEL 2 VUV
MoreSpectroscopic Ellipsometer UVISEL 2 VUV
A versatile spectroscopic ellipsometer covering a large range from VUV to NIR
ViewSizer 3000*
MoreViewSizer 3000*
The Better Way to Characterize Nanoparticles
XGT-7200
MoreXGT-7200
X-ray Analytical Microscope
XGT-9000
MoreXGT-9000
X-ray Analytical Microscope
GDOES Accessories
MoreGDOES Accessories
Accessories for samples with various shapes, sizes and properties
GDOES Software
MoreGDOES Software
Quantum and Image
Glow Discharge Optical Emission Spectrometer - GD-Profiler 2™
MoreGlow Discharge Optical Emission Spectrometer - GD-Profiler 2™
Discover a Whole New World of Information
ICP Neo
MoreICP Neo
ICP Software
ICP-OES
MoreICP-OES
Complete your ICP-OES Spectrometer for your specific needs
Inductively Coupled Plasma Optical Emission Spectrometer - Ultima Expert
MoreInductively Coupled Plasma Optical Emission Spectrometer - Ultima Expert
High resolution, high sensitivity and high stability ICP-OES
Inductively Coupled Plasma - Ultima Expert LT
MoreInductively Coupled Plasma - Ultima Expert LT
Affordable high performance ICP-OES
Inductively Coupled Plasma Optical Emission Spectrometer - Made to Measure - Customized
MoreInductively Coupled Plasma Optical Emission Spectrometer - Made to Measure - Customized
For your specific application
MESA-50
MoreMESA-50
X-Ray Fluorescence Analyzer
MESA-50K
MoreMESA-50K
X-Ray Fluorescence Analyzer
XGT-7200
MoreXGT-7200
X-ray Analytical Microscope
XGT-9000
MoreXGT-9000
X-ray Analytical Microscope