XGT-9000

X-ray Analytical Microscope

The evolution of μXRF! Combination of improved sensitivity and new imaging technology achieved high speed analysis of foreign materials in only one unit.

Segment: Scientific

Division: X-ray Fluorescence Analyzers

Manufacturing Company: HORIBA, Ltd.

Simple analysis operation with no preparation required and non-destructive analysis.
Measurement points can be accessed quickly through high-precision optical observation, even in the microscopic range.
Complete with a variety of image analysis software.

Clear and High-speed Image Mapping

Shortened analysis time facilitates efficient measurement work.
X-ray images with very little noise allow for even clearer observation.

Clear Optical Image Observation and Coaxial X-ray Irradiation

Equipped with three kinds of illumination: coaxial, around and transmitted. Combining coaxial and around illuminations enables clear observation of samples with areas that are uneven, mirrored, etc.

Coaxial, perpendicular X-ray exposure and optical image observation prevent the measurement position of samples from becoming misaligned.

Employing of imaging technology based on Raman imaging technique

Highlighting a certain element as a characteristic point simplifies detection of foreign material, obstacles, etc.

A New Solution in Foreign Material Analysis

Foreign material is detected quickly through high-speed screening and highlighting through imaging processing. Additionally, the high resolution X-ray beam enables detailed analysis of elements contained in foreign material. This series of foreign material analyses can be completed with a single unit, up to the level of several ten μm.

Applications

■ Analysis of Foreign Material in Films

Even difficult to visually confirm foreign materials can be detected and analyzed while checking optical observation images with high resolution of them after elemental mapping screening.

■ Analysis of Hydrous Samples

Enables measurement of hydrous samples and foreign materials can be detected through image processing.

Model	XGT-9000	XGT-9000SL
Basic information
Instrument	X-ray fluorescence analytical microscope
Sample type	Solids, Liquids, Particles
Detectable elements	F　－　Am
Chamber size	450(W) x 500(D) x 80(H)	1030(W) x 950(D) x 500(H)
Maximum sample size	300(W) x 250(D) x 80(H)	500(W) x 500(D) x 500(H)
Maximum mass of sample	1 kg	10 kg
Optical observation	Two high resolution cameras with objective lens
Optical design	Vertical-Coaxial X-ray and Optical observation
Sample illumination/observation	Top, Bottom, Side illuminations/Bright and Dark fields
X-ray tube
Power	50 W
Voltage	Up to 50 kV
Current	Up to 1 mA
Target material	Rh
X-ray optics
Number of probes	Up to 4
Primary X-ray filters for spectrum optimization	5 positions
Detectors
X-ray Fluorescence detector	Silicon Drift Detector (SDD)
Transmission detector	NaI(Tl)
Mapping analysis
Mapping area	100 mm x 100 mm	350 mm x 350 mm
Step size	2 mm	4 mm
Operating mode
Sample environment	Full vacuum / Partial vacuum / Ambient condition	Partial vacuum / Ambient condition* * Detectable elements for SL version are from Na to Am

Dimensions (unit: mm)

Optical Micro-spectroscopies on a Path to Identify the Source of Life

In this article, we present how our Raman and X-Ray Fluorescence microscopies can be combined to shed some light on the origins of the universe. We show some examples on a meteorite piece and on water inclusion in quartz matrix.

XGT-9000

X-ray Analytical Microscope

Clear and High-speed Image Mapping

Clear Optical Image Observation and Coaxial X-ray Irradiation

Employing of imaging technology based on Raman imaging technique

A New Solution in Foreign Material Analysis

Applications

Dimensions (unit: mm)

Laurent Fullana appointed President of HORIBA France

HORIBA Scientific Announces New Micro XRF Analytical Microscope

Energy Dispersive X-ray Fluorescence

Request for Information

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