XGT-9000

XGT-9000

X-ray Analytical Microscope

The evolution of μXRF! Combination of improved sensitivity and new imaging technology achieved high speed analysis of foreign materials in only one unit.

Segment: Scientific
Manufacturing Company: HORIBA, Ltd.
  • Simple analysis operation with no preparation required and non-destructive analysis.
  • Measurement points can be accessed quickly through high-precision optical observation, even in the microscopic range.
  • Complete with a variety of image analysis software.

 

Clear and High-speed Image Mapping

  • Shortened analysis time facilitates efficient measurement work.
  • X-ray images with very little noise allow for even clearer observation.

Clear Optical Image Observation and Coaxial X-ray Irradiation

  • Equipped with three kinds of illumination: coaxial, around and transmitted. Combining coaxial and around illuminations enables clear observation of samples with areas that are uneven, mirrored, etc.

  • Coaxial, perpendicular X-ray exposure and optical image observation prevent the measurement position of samples from becoming misaligned.
     

 

Employing of imaging technology based on Raman imaging technique

Highlighting a certain element as a characteristic point simplifies detection of foreign material, obstacles, etc.

A New Solution in Foreign Material Analysis

Foreign material is detected quickly through high-speed screening and highlighting through imaging processing. Additionally, the high resolution X-ray beam enables detailed analysis of elements contained in foreign material. This series of foreign material analyses can be completed with a single unit, up to the level of several ten μm.

Applications

■ Analysis of Foreign Material in Films

Even difficult to visually confirm foreign materials can be detected and analyzed while checking optical observation images with high resolution of them after elemental mapping screening.

■ Analysis of Hydrous Samples

Enables measurement of hydrous samples and foreign materials can be detected through image processing.

Basic Information

Principle

Energy dispersive X-ray fluorescence 

Element range

Na (11) ~ U (92)

Largest sample size [W x D x H]

300 x 250 x 40 mm

Stage movable range [W x D x H]

100 x 200 x 20 mm

Optical image

Whole/detailed area

Direction of optical observation and X-ray beam

Coaxial

X-ray Tube

Tube voltage

15 kV, 30 kV, 50 kV

Tube current

Max 1 mA

Target material

Rh

X-ray optics

Maximum No. of capillaries

3

Detector

X-ray Fluorescence detector

LN2 Free detector
(SDD)

Transmission X-ray detector

Yes

Mapping

Mapping range

100 x 100 mm (max)

Pixel numbers

4 types, switchable

Optical camera (for detailed observation)

Observation range

2.5 x 2.5 mm

Optical resolution

<10 μ m

Working distance

Variable between 1 – 10 mm

Illumination

Around, coaxial, transmitted

Other

Vacuum range

Whole sample chamber /optical system only

External Dimensions (unit: mm)

* When installing the product, please follow the related laws and/or regulations of your country.

Analytical Chemistry in Pharmaceuticals and Medicine Manufacturing
Analytical Chemistry in Pharmaceuticals and Medicine Manufacturing
Hazardous Substances in Food and Beverage Manufacturing
Hazardous Substances in Food and Beverage Manufacturing
Analytical Chemistry in Biotechnology
Analytical Chemistry in Biotechnology
Battery Evaluation in Electrical Equipment
Battery Evaluation in Electrical Equipment
Analytical Chemistry in Plastics and Rubber
Analytical Chemistry in Plastics and Rubber
Analytical Chemistry in Electrical Equipment
Analytical Chemistry in Electrical Equipment
Micro-XRF for non destructive analysis of museum and archaeological objects
Micro-XRF for non destructive analysis of museum and archaeological objects
The XGT-5000 is ideally suited for analysis of archaeology specimens and museum objects. Analysis of a coloured illustration in a Nepalese manuscript was carried out to understand more fully the types of pigments used to obtain particular hues. Due to the penetrating nature of x-rays it was possible to probe not only the topmost layer of pigments, but also those which had been used for undercoating.

Request for Information

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