XGT-9000

XGT-9000

X-ray Analytical Microscope

The evolution of μXRF! Combination of improved sensitivity and new imaging technology achieved high speed analysis of foreign materials in only one unit.

Segment: Scientific
Division: X-ray Fluorescence Analyzers
Manufacturing Company: HORIBA, Ltd.
  • Simple analysis operation with no preparation required and non-destructive analysis.
  • Measurement points can be accessed quickly through high-precision optical observation, even in the microscopic range.
  • Complete with a variety of image analysis software.

 

Clear and High-speed Image Mapping

  • Shortened analysis time facilitates efficient measurement work.
  • X-ray images with very little noise allow for even clearer observation.

Clear Optical Image Observation and Coaxial X-ray Irradiation

  • Equipped with three kinds of illumination: coaxial, around and transmitted. Combining coaxial and around illuminations enables clear observation of samples with areas that are uneven, mirrored, etc.

  • Coaxial, perpendicular X-ray exposure and optical image observation prevent the measurement position of samples from becoming misaligned.
     

 

Employing of imaging technology based on Raman imaging technique

Highlighting a certain element as a characteristic point simplifies detection of foreign material, obstacles, etc.

A New Solution in Foreign Material Analysis

Foreign material is detected quickly through high-speed screening and highlighting through imaging processing. Additionally, the high resolution X-ray beam enables detailed analysis of elements contained in foreign material. This series of foreign material analyses can be completed with a single unit, up to the level of several ten μm.

Applications

■ Analysis of Foreign Material in Films

Even difficult to visually confirm foreign materials can be detected and analyzed while checking optical observation images with high resolution of them after elemental mapping screening.

■ Analysis of Hydrous Samples

Enables measurement of hydrous samples and foreign materials can be detected through image processing.

ModelXGT-9000XGT-9000SL
Basic information
InstrumentX-ray fluorescence analytical microscope
Sample typeSolids, Liquids, Particles
Detectable elementsF - Am
Chamber size450(W) x 500(D) x 80(H)1030(W) x 950(D) x 500(H)
Maximum sample size300(W) x 250(D) x 80(H)500(W) x 500(D) x 500(H)
Maximum mass of sample1 kg10 kg
Optical observationTwo high resolution cameras with objective lens
Optical designVertical-Coaxial X-ray and Optical observation
Sample illumination/observationTop, Bottom, Side illuminations/Bright and Dark fields
X-ray tube
Power50 W
VoltageUp to 50 kV
CurrentUp to 1 mA
Target materialRh
X-ray optics
Number of probesUp to 4
Primary X-ray filters for spectrum optimization5 positions
Detectors
X-ray Fluorescence detectorSilicon Drift Detector (SDD)
Transmission detectorNaI(Tl)
Mapping analysis
Mapping area100 mm x 100 mm350 mm x 350 mm
Step size2 mm4 mm
Operating mode
Sample environmentFull vacuum / Partial vacuum /
Ambient condition
Partial vacuum / Ambient condition*
* Detectable elements for SL version are from Na to Am

Dimensions (unit: mm)

Micro-XRF for non destructive analysis of museum and archaeological objects
Micro-XRF for non destructive analysis of museum and archaeological objects
Pigments used in an ancient Nepalese manuscript have been analysed and assigned and an ancient glass burial ornament has been probed to identify the specific colouring additives used.
Biological applications of XRF microscopy
Biological applications of XRF microscopy
The effect of zinc on gastric ulcer healing has been investigated - mapped imaging of tissue samples shows evidence of zinc accumulation within the ulcerated tissue. In a separate study a fish otolith ('ear bone') has been analysed to reveal its heterogeneous elemental composition and physical structure.
Elemental micro-analysis of leaves using EDXRF
Elemental micro-analysis of leaves using EDXRF
Calcium micro-nodules are identified within mulberry leaves, and XRF mapped imaging provides a correlation between nodule concentration and leaf age. In a seperate study, the uptake of heavy element pollutants by plants is investigated, with high resolution images quickly acquired to show the distribution of lead through the leaf.
Elemental analysis of single rice grains using XRF micro-analysis
Elemental analysis of single rice grains using XRF micro-analysis
Individual rice grains are analyzed by micro-XRF to examine the effect of grain polishing. The concentration of mineral elemnts found on a grain can be related to the degree of polish.
Micro-XRF analysis for the Electronics Industry
Micro-XRF analysis for the Electronics Industry
The combination of the XGT-5000’s ground breaking spatial resolution and sensitivity means it is the instrument of choice for fast analysis of electronic components, whether for analysis of restricted harmful elements (the WEEE/RoHS ‘lead free’ legislation), trouble shooting, or R&D.
Quality control and defect analysis in the electronics industry using micro-XRF
Quality control and defect analysis in the electronics industry using micro-XRF
Troubleshooting and defect analyses of components embedded within opaque resins are described, on both individual components and complete circuit boards. Quantitative analysis to the ppm level is ideally suited for ensuring compliance to the WEEE/RoHS directives.
Fast thickness measurement of thin metal coatings by Micro-XRF
Fast thickness measurement of thin metal coatings by Micro-XRF
The penetrating nature of EDXRF analysis allows multi-layered samples to be characterised with a single measurement. With high spatial resolution even microscopic features such as bonding pads on circuit boards can be interrogated for composition and layer thickness.
Micro-XRF analysis for lead contamination in toys
Micro-XRF analysis for lead contamination in toys
A plastic toy is analysed for the presence of lead within its many components. Spot analysis shows concentrations of this harmful element can reach as high as 0.3%. XRF imaging allows its distribution across the toy to be quickly characterised.
Fingerprint imaging with micro-XRF
Fingerprint imaging with micro-XRF
High spatial resolution elemental mapping experiments are demonstrated to provide a useful method of fingerprint analysis in situations where traditional methods struggle. Fingerprints on glossy paper and finely woven fabrics have been chemically treated, and subsequently imaged.
X-ray micro-analysis for pearl characterisation in forensic science
X-ray micro-analysis for pearl characterisation in forensic science
Simultaneous XRF and transmission x-ray imaging provides valuable insight into the composition and structure of pearls. Such information is vital for customs officials, who can quickly determine whether pearls are natural, cultured or imitation.
Gun Shot Residue analysis using X-ray fluorescence micro-analysis
Gun Shot Residue analysis using X-ray fluorescence micro-analysis
Micro-XRF analysis of gun shot residues allows individual microscopic particles to be characterized for elemental composition. In addition, automated element imaging provides high spatial resolution element distribution maps, allowing particle shapes and sizes to be accurately analyzed.
Particle Analysis of Film and Battery
Particle Analysis of Film and Battery
The XGT-9000 can detect and determine the composition of foreign particles, and therefore track the source of contamination.
QC, Counterfeit Products, Presence of Foreign Materials
QC, Counterfeit Products, Presence of Foreign Materials
X-ray Fluorescence photons can be partially absorbed by the encapsulated material and will not show in the spectrum. The X-ray transmission image provides a complete picture.
QC of Semiconductors which Feature Thin and Narrow Patterns
QC of Semiconductors which Feature Thin and Narrow Patterns
The combination of microbeam and thickness measurement capability makes the XGT-9000 a useful tool for the QC of semiconductors, which feature thin and narrow patterns. Thickness sensitivity depends on elements traced, but can be at the Angstrom level.
Analysis of Hydrous Samples like Salami
Analysis of Hydrous Samples like Salami
Enables measurement of hydrous samples and foreign materials can be detected through image processing.
The non-destructive identification of black ink in a tempered document using XGT-9000
The non-destructive identification of black ink in a tempered document using XGT-9000
μ-XRF is one of the powerful non-destructive analytical technique in forensic science application. Thanks to the elemental mapping and the spectrum search function, XGT-9000 enables to reveal intentional alternation and identify the ink used on a document.

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