XGT-9000SL

X-ray Analytical Microscope Super Large Chamber Model

Microscopic analysis on large samples without compromising safety

  • Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm
  • X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure
  • Mapping area size up to 350 x 350 mm2
  • <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution
  • Dual types of detectors for transmission and fluorescent X-rays
  • Detectable element range down to C with a light element detector and He purge module
Segment: Scientific
Manufacturing Company: HORIBA, Ltd.

How the XGT-9000SL provides the ultimate performance in speed and flexibility

Excitation system

XGT-9000SL allows X-ray fluorescence analysis at the microscopic level even on a large sample by using microprobes such as <15 µm and <100 µm ultra-high intensity probes. The X-ray generator can offer high output of X-ray irradiation up to 50 kV and 1000 µA. Thus, the high performance of the excitation system provides ultimate performance and flexibility for your large sample analysis.

Optical images

Capturing clear images is critical for micro-XRF. XGT-9000SL provides two types of cameras to grasp the image of the whole sample and its details down to the microscopic level. Multiple illumination modes help to observe brilliant images, even for reflective and transparent samples.

Sample chamber

XGT-9000SL’s large chamber capacity (1030 mm x 950 mm x 500 mm) can accommodate a wide variety of samples from micro-size fragments to samples as large as electronic circuit boards and paintings. XGT-9000SL is equipped with X-ray shields complying with JAIMAS0101-2001/IEC1010-1, which protect you from X-ray exposure. XGT-9000SL can allow sample analysis without destructive sample preparation or compromising your safety.

Detectors

XGT-9000SL provides both a transmission X-ray detector and a fluorescent X-ray detector. The transmission X-ray detector enables users to detect internal defects and foreign matter of a sample. The fluorescent X-ray detector can detect from Americium down to carbon, with a light elements detector and He-purge module.

Software suite

XGT-9000SL software, of course, covers all basic measurements such as single spot analysis, multiple spot analysis, line analysis, and map imaging. Apart from the standard software functions, advanced modules can be added to the software suite to provide more comprehensive user experiences. These include:

  • Multilayer FPM module for thickness measurement with/without standards
  • RoHS module for RoHS screening
  • Queue module for automated multiple measurements in unattended mode
  • Particle Finding module for particle composition/classification analysis and co-localized analysis
  • LabSpec Link module for data transfer to LabSpec 6 for multivariate analysis
 

Application  Examples

Click here for more details

Basic information

InstrumentX-ray fluorescence analytical microscope
Sample typeSolids, Liquids, Particles
Detectable elementsC* – Am with optional light elements detector
F* – Am with standard detector
*He purge condition is necessary to detect down to carbon and fluorine for both detectors
Available chamber size1030(W) x 950(D) x 500(H)
Maximum sample size500(W) x 500(D) x 500(H)
Maximum mass of sample10 kg
Optical observationTwo high resolution cameras with objective lens
Optical designVertical-Coaxial X-ray and Optical observation
Sample illumination/observationTop, Bottom, Side illuminations/Bright and Dark fields

X-ray tube

Power50 W
VoltageUp to 50 kV
CurrentUp to 1 mA
Target materialRh

X-ray optics

Number of probesUp to 4
Primary X-ray filters for spectrum optimization5 positions

Detectors

X-ray Fluorescence detectorSilicon Drift Detector (SDD)
Transmission detectorNaI(Tl)

Mapping analysis

Mapping area350 mm x 350 mm
Step size4 mm

Operating mode

Sample environmentPartial vacuum / Ambient condition / He purged condition (optional)*
*He purge condition is necessary to detect down to carbon and fluorine for both detectors.

Dimensions (unit: mm)

Non-destructive large area elemental map imaging on the painting “Flower Vase with Thistles” using the XGT-9000SL
Non-destructive large area elemental map imaging on the painting “Flower Vase with Thistles” using the XGT-9000SL
Pigments are important clues to the historical background of artworks. This application note introduces elemental map imaging performed on Vincent van Gogh’s oil painting “Flower Vase with Thistles” using the XGT-9000SL. The results reveal that elemental compositions of the pigments used on the painting were different from ones previously reported to have been used by van Gogh. It suggests that this painting was a replica of the artwork.
Elemental distribution imaging and catalyst loading content calculation on a fuel cell sample
Elemental distribution imaging and catalyst loading content calculation on a fuel cell sample
The XGT-9000SL’s large chamber capacity and microprobes allow elemental distribution imaging up to 350 x 350 mm2 with high spatial resolution at the microscopic level.
Surface analysis on a brake rotor of automotive tire
Surface analysis on a brake rotor of automotive tire
The XGT-9000SL’s large chamber capacity allows you to put whole a brake rotor and carry out spectrum analysis and elemental distribution imaging on the rotor surface, non-destructively.
Non-destructive failure analysis on a large printed circuit board
Non-destructive failure analysis on a large printed circuit board
Our XGT-9000SL allows failure analysis at a microscopic level on a large sample, non-destructively, thanks to its large chamber capacity and its microprobes.

Request for Information

Do you have any questions or requests? Use this form to contact our specialists. * These fields are mandatory.

Related products

AP-370 series
More AP-370 series

Air Pollution Monitor

APDA-371
More APDA-371

Ambient Dust Monitor

APDA-372
More APDA-372

Ambient Dust Monitor

AQMS
More AQMS

Ambient Air Quality Monitoring System

Auto SE
More Auto SE

Spectroscopic Ellipsometer for Simple Thin Film Measurement

Auto SE Accessories
More Auto SE Accessories

Customize your instrument

Auto Soft
More Auto Soft

Intuitive Auto-Soft Interface for the Auto SE and Smart SE

DataOverlay
More DataOverlay

Hybrid Chemical and Video Image Display

DeltaPsi2 Software
More DeltaPsi2 Software

A Platform for HORIBA Scientific Ellipsometers

DLC
More DLC

Automated DLC Coating Analysis

EasyImage
More EasyImage

Optimized Analytical Workflow

GD-Profiler 2™
More GD-Profiler 2™

Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer

GDOES Accessories
More GDOES Accessories

Accessories for samples with various shapes, sizes and properties

GDOES Software
More GDOES Software

Quantum and Image

ICP Neo
More ICP Neo

ICP Software

ICP-OES
More ICP-OES

Complete your ICP-OES Spectrometer for your specific needs

Image Enhancement
More Image Enhancement

Emphasize Raman and Optical Images

KnowItAll
More KnowItAll

Raman Spectral Searching

LabRAM HR Evolution
More LabRAM HR Evolution

Confocal Raman Microscope

LabRAM Nano
More LabRAM Nano

AFM-Raman for physical and chemical imaging

LabRAM Soleil
More LabRAM Soleil

Raman Microscope

LabRAM Soleil Nano
More LabRAM Soleil Nano

Real-time and Direct Correlative Nanoscopy

LabSpec 6: Validated performance
More LabSpec 6: Validated performance

LabSpec 6 is a validated software

LEM Series
More LEM Series

Camera Endpoint Monitor based on Real Time Laser Interferometry

MESA-50
More MESA-50

X-Ray Fluorescence Analyzer

MESA-50K
More MESA-50K

X-Ray Fluorescence Analyzer

Methods
More Methods

Recall settings, and automate processes

MEXA-2000SPCS series
More MEXA-2000SPCS series

Solid Particle Counting System

MultiPoints
More MultiPoints

Automatic Acquisition of Raman Spectra at Multiple Positions

Multivariate Analysis
More Multivariate Analysis

Data analysis for complex data sets

MVAPlus
More MVAPlus

Multivariate Analysis App for all Raman Maps

OBS-ONE PM unit
More OBS-ONE PM unit

On-board Emissions Measurement System

OneClick
More OneClick

Fast and easy Raman acquisition

OpenPleX
More OpenPleX

Manual label-free molecular interaction analysis machine Flexible Research Platform

Particle Finder
More Particle Finder

Measure, Indentify, and Classify Particles

Plasma Profiling TOFMS
More Plasma Profiling TOFMS

Ultra-Fast, Sensitive and High Resolution Depth Profiling technique

PP-TOFMS Software
More PP-TOFMS Software

Ergonomic software for data acquisition, data treatment and technical support

PX-375
More PX-375

Continuous Particulate Monitor with X-ray Fluorescence

Si Stress
More Si Stress

Automated Silicon Stress Analysis

Smart SE
More Smart SE

Powerful and Cost Effective Spectroscopic Ellipsometer

SmartSampling
More SmartSampling

Turns Raman Imaging from Hours to Minutes

Spectroscopic Ellipsometer - Large area mapping Ellipsometers
More Spectroscopic Ellipsometer - Large area mapping Ellipsometers

For Flat Panel Display and Photovoltaic Industries

TFH-01/47
More TFH-01/47

PTFE Filter/TFH membrane

Ultima Expert
More Ultima Expert

High resolution, high sensitivity and high stability ICP-OES

Ultima Expert LT
More Ultima Expert LT

Affordable high performance ICP-OES

User Accounts
More User Accounts

Password protected user access control

UVISEL 2 VUV
More UVISEL 2 VUV

A versatile spectroscopic ellipsometer covering a large range from VUV to NIR

UVISEL Plus
More UVISEL Plus

Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm

UVISEL Plus In-Situ
More UVISEL Plus In-Situ

In-situ spectroscopic ellipsometer for real-time thin film monitoring

XGT-9000
More XGT-9000

X-ray Analytical Microscope (Micro-XRF)

XploRA Nano
More XploRA Nano

AFM-Raman for Physical and Chemical imaging

XploRA™ PLUS
More XploRA™ PLUS

Raman Spectrometer - Confocal Raman Microscope

MESA-50
More MESA-50

X-Ray Fluorescence Analyzer

MESA-50K
More MESA-50K

X-Ray Fluorescence Analyzer

MESA-7220*
More MESA-7220*

Measurement of Sulfur and Chlorine in Petroleum Products

MESA-7220V2
More MESA-7220V2

X-ray Fluorescence Sulfur/Chlorine-in-oil Analyzer

PX-375
More PX-375

Continuous Particulate Monitor with X-ray Fluorescence

SLFA-20
More SLFA-20

X-ray Fluorescence Sulfur-in-Oil Analyzer

SLFA-2100/2800
More SLFA-2100/2800

X-ray Fluorescence Sulfur-in-Oil Analyzers

SLFA-60
More SLFA-60

X-ray Fluorescence Sulfur-in-Oil Analyzer

SLFA-6000
More SLFA-6000

X-ray Fluorescence Sulfur-in-Oil Analyzer

X-5000*
More X-5000*

Energy Dispersive X-ray Fluorescence Analyzer

XGT-9000
More XGT-9000

X-ray Analytical Microscope (Micro-XRF)