Compound CIGS
Compound CIGS production process and HORIBA's products supporting this process.
Compound CIGS
Below you can see the different stages during the Compound CIGS production process. Please click on each phase in order to see the products that are avaialble to you during this stage.
Resistivity meter having the 2-channel carbon sensor. Measurement range: 0 - 100.0 MΩ・cm
CODA-500: High-Performance Automatic CODMN Monitor Created Through Advanced Technology and More Than 30 Years of Accumulated Expertise
Measures the conductivity ranging from purified water up to 2000 µS/cm for pharmaceuticals, food, and cosmetics applications
Measure the ultra-low density of silica at the finest sensitivity of 0.01 µg/L (0.01 ppb).
The IF-250 Simple Fluoride Ion Monitor for use in industry provides continuous measurements of the free fluoride ion concentration in waste water and other test samples using the fluoride ion electrode method.
The unit can be used on a range of test samples with varying concentrations from 0.0 to 10.0 mg / L up to 0 to 10,000 mg / L. This makes the IF-250 the ideal unit for monitoring the treatment of waste water and effluent resulting from the semiconductor production process, as well as electronic and glass factories using fluoride in the production process.
A state-of-the-art model adopting 60 years of water measurement technology, which achieves a reduction in life cycle costs, and compliance with regulations and corporate compliance.
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EMAX ENERGY combined with SEM is an energy dispersive X-ray analyzer which is suited for foreign material and composition analysis. It matches the samples in many applications.
Analyzer is designed to provide pertinent...
The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin film characterization and process studies.
High spectral resolution analytical Raman microscope for ultimate performance and flexibility; includes UV Raman configuration, full automation and wide range of accessories.
Silicon crystal is widely used in semiconductors. The PHOTOLUMINOR-D has been designed especially for quantitative impurity analysis of silicon crystals with high sensitivity.
The application of photoluminescence for the quality...
Single point analysis and automated hyperspectral imaging.
Dual vacuum modes.
Spot sizes from 1.2 mm to 10 µm.
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Visualize your sample and measure thin film thickness and optical constants in seconds.
"With Auto SE, routine work will never be the same!"
NEW NIR Extended Spectral Range !
The ultimate solution to every challenge in thin film measurement