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Concurrent two-laser excitation in TERS analysis - Application note
Simultaneous dual-laser TERS on WS2 thin flakes enriches spectra, reveals optoelectronic insights, cuts acquisition time and avoids probe variation.
Transition metal dichalcogenides present interesting optoelectronic properties that are strictly related to their crystalline structure (mono- or multilayer, presence of defects or dopants), and that influence in turn the Raman response of the material depending on the employed excitation wavelength. This is why the study presented in this application note proposed a new approach: WS2 nanoflakes were measured via nanoRaman with a 633 and a 785 nm laser simultaneously. Since the same TERS probe collected both responses at the same time, the differences observed in the signals can only be attributed to the different interaction of the flake with each excitation wavelength, hence giving precious insights on the WS2 optical properties.
AFM-Raman for physical and chemical imaging
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