Ellipsometry is a well-known, yet sometimes not well understood, characterization techniques for thin films. Based on light polarization and indirect determination of parameters, ellipsometry enables obtaining thin film thickness and optical parameters, roughness, porosity or even compositional information about simple layers & complex stacks. Very useful in the fields of semiconductors, PV, optical coatings and every application using thin films, ellipsometry reached for some years now an instrumental maturity which enables to open its use to non-expert users. Come and (re)discover the basics of this powerful technique for your materials characterization needs!

With their ~20 % efficiency, hybrid perovskite solar cells are the new promising candidate for next generation photovoltaics. Thanks to the wide HORIBA Scientific portfolio, different techniques can be used to gain in depth knowledge on the optoelectronic properties and mechanisms of this class of materials. In this application note we decided to use spectroscopic ellipsometry, steady-state and time-resolved fluorescence and Glow Discharge Optical Emission Spectroscopy to investigate the properties of CH3NH3PbI3 thin films deposited on a spin-coated PEDOT:PSS. The impact of the exposure to air was addressed.

Discover the webinar from Dr Arnaud Etcheberry (ILV, Versailles, France)