
Model | XGT-9000SL | |
XGT-9000SL Pro | XGT-9000SL C | |
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Instrument | X-ray analytical microscope with a super large chamber | |
Principle | Energy dispersive X-ray fluorescence spectroscopy | |
Detectable elements | F (9)* - Am (95) | C (6)* - Am (95) |
Available chamber size | 1030 mm (W) x 950 mm (D) x 500 mm (H) | |
Maximum stage loading capacity | 10 kg | |
Maximum mapping area | 350 mm x 350 mm on 500 mm x 500 mm | |
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Optical image observation | Two high resolution cameras | |
Whole image Detailed image | 5 million pixels, Field of view: 350 mm x 350 mm 5 million pixels, Field of view: 2.5 mm x 2.5 mm | |
Optical design | Vertical-coaxial X-ray and optical observation | |
Sample illumination / Observation | Top, bottom, side illuminations / Bright and dark fields | |
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Power | Up to 50 W | |
Voltage | Up to 50 kV | |
Current | Up to 1 mA | |
Target material | Rh | |
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Probe spot size selection | Various probe combination can be offered (e.g. 15 μm ultra-high intensity probe and 100 μm ultra-high intensity probe can be chosen) | |
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X-ray fluorescence detector | Liquid nitrogen-free Silicon Drift Detector (SDD) | |
Transmission detector | NaI (Tl) | |
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Measurement environment | Partial vacuum Whole ambient He purge (optional)* | Partial vacuum Whole ambient He purge (optional)* |
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Instrument size | 1090 mm (W) x 1380 mm (D) x 1820 mm (H) | |
Mass weight | Approximately 550 kg |
*He purge condition is necessary to detect down to fluorine with XGT-9000SL Pro or down to carbon with XGT-9000SL C.