Semiconductors

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GDOES Software
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XploRA™ PLUS
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LabRAM Odyssey
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F-CLUE
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Plasma Profiling TOFMS
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Ultra-Fast, Sensitive and High Resolution Depth Profiling technique

i-CLUE
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SLIA-300
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Smart SE
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OmegaScope
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EMIA-Step
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Auto SE
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Cathodoluminescence - CLUE Series
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Cathodoluminescence Solutions for Electron Microscopy

UVISEL Plus
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Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm

UVISEL 2 VUV
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Partica LA-960V2
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UP-100
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Partica LA-960
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HP-480(W)
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HE-480C-GC
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Carbon Sensor Conductivity Meter (Low concentration type)

HE-960RW-GC
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CS-700
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