XploRA Nano

AFM-Raman for Physical and Chemical imaging

Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.

Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.

Segment: Scientific

Division: Molecular and Microanalysis

Manufacturing Company: HORIBA France SAS

Multi-sample analysis platform

Macro, micro and nano scale measurements can be performed on the same platform.

Ease-of-use

Fully automated operation, start measuring within minutes, not hours!

True confocality

High spatial resolution, automated mapping stages, full microscope visualization options.

High collection efficiency

Top-down and oblique Raman detection for optimum resolution and throughput in both

co-localized and Tip-Enhanced measurements (Raman and Photoluminescence).

High spectral resolution

Ultimate spectral resolution performance, multiple gratings with automated switching, wide spectral range analysis for Raman and PL.

High spatial resolution

Nanoscale spectroscopic resolution (down to 10 nm) through Tip Enhanced

Optical Spectroscopies (Raman and PhotoLuminescence).

Multi-technique / Multi-environment

Numerous SPM modes including AFM, conductive and electrical modes (cAFM,

KPFM), STM, liquid cell and electrochemical environment, together with chemical mapping

through TERS/TEPL. Full control of the 2 instruments through one workstation and a powerful software control, SPM and spectrometer can be operated simultaneously or independently

Robustness/Stability

High resonance frequency AFM scanners, operation far away from noises! High

performance is obtained without active vibration isolation.

SmartSPM Scanner and Base

Sample scanning range: 100 µm x 100 µm x 15 µm (±10 %)

Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %

Noise: 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth

Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)

X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm

Sample size: Maximum 40 x 50 mm, 15 mm thickness

Sample positioning: Motorized sample positioning range 5 x 5 mm

Positioning resolution: 1 µm

AFM Head

Laser wavelength: 1300 nm, non-interfering with spectroscopic detector

Alignment: Fully automated cantilever and photodiode alignment

Probe access: Free access to the probe for additional external manipulators and probes

SPM Measuring Modes

Contact AFM in air/(liquid optional); Semicontact AFM in air/(liquid optional); Non -contact AFM; Phase imaging; Lateral Force Microscopy (LFM); Force Modulation; Conductive AFM (optional); Magnetic Force Microscopy (MFM); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Capacitance and Electric Force Microscopy (EFM); Force curve measurement; Piezo Response Force Microscopy (PFM); Nanolithography; Nanomanipulation; STM (optional); Photocurrent Mapping (optional); Volt-ampere characteristic measurements (optional)

Spectroscopy Modes

Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy

Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes

Tip-EnhancedPhotoluminescence (TEPL)

Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)

Conductive AFM Unit (optional)

Current range: 100 fA ÷ 10 µA; 3 current ranges (1 nA, 100 nA and 10 µA) switchable from the software

Optical Access

Capability to use simultaneously top and side plan apochromat objective: Up to 100x, NA = 0.7 from top or side; Up to 20x and 100x simultaneously

Closed loop piezo objective scanner for ultra stable long term spectroscopic laser alignment: Range 20 µm x 20 µm x 15 µm; Resolution: 1 nm

Spectrometer

Fully automated XploRA Plus compact micro-spectrometers, functional as stand-alone micro-Raman microscope

Wavelength range: 75 cm^-1to 4000 cm^-1

Gratings: 4 gratings on computer controlled turret (600, 1200, 1800 and 2400 g/mm)

Automation: Fully motorized, software controlled operation

Detection

Full range of CCD detectors and EMCCDs.

Laser Sources

Typical wavelength: 532 nm, 638 nm, 785 nm. Other wavelengths available on request.

Automation: Fully motorized, software controlled operation

Software

Integrated software package including full featured SPM, spectrometer and data acquisition control, spectroscopic and SPM data analysis and processing suite, including spectral fitting, deconvolution and filtering, optional modules include univariate and multivariate analysis suite (PCA, MCR, HCA, DCA), particle detection and spectral search functionalities.

Characterization of Nanoparticles from Combustion Engine Emission using AFM-TERS

A new concern for human health is now raised by sub-23 nm particles emitted by on-road motor vehicles. Beyond measuring particle number and mass, it is also critical to determine the surface chemical composition of the nanoparticles to understand the potential reactivity with the environment.

Correlated TERS, TEPL and SPM Measurements of 2D Materials

Many challenges remain before the promise of 2D materials is realized in the form of practical nano-devices. An information-rich, nanoscale characterization technique is required to qualify these materials and assist in the deployment of 2D material-based applications.

Characterization of Carbon Nanotubes Using Tip-Enhanced Raman Spectroscopy (TERS)

The use of TERS to reveal the defects density in the structure of CNTs is of interest for a better understanding of the electrical properties of the devices made with such nano-objects. Not only defects concentration but also local chirality changes from the different radial breathing modes, pressure effect and strain distribution can be studied at the single carbon nanotube level through TERS.

Characterization of MoS2 Flakes using TEOS

Both TEPL and TERS images are well correlated with AFM morphological images obtained simultaneously, and all are consistent in revealing the nature (number of layers) of MoS2 flakes. Upon deconvolution, the TEPL signal is even capable of revealing local inhomogeneities within a MoS2 flake of 100 nm size. Kelvin probe measurement supports TEPL and TERS measurements and adds to the power of such tip-enhanced combinative tools. TEOS characterization of 2D materials is likely to contribute to further deployment of these materials into commercial products through a better understanding of their electrical and chemical properties at the nanoscale.

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