Raman Technology

Can Raman measure thickness of thin films on transparent substrates?

Thin films thickness measurement in a few words

Yes, Raman can measure film thickness on transparent substrates like glass or polymers. Indeed, Raman spectroscopy can measure anything that respect optical laws. However, the precision is constrained by the diffraction limit, which sets an axial resolution limit of around one micron. Thicknesses below this limit cannot be accurately determined, but for thicker films, precise measurements are possible.

Let's give you more information about that topic below, with a short video answer from our Raman specialist. Go further with related application notes and webinar, or learn more about our solutions for precise measurement of film thickness.

>> Explore our solutions for Raman analysis <<

A short answer from our Raman specialist

More information about thin films analysis

Webinar: Thin & Thick Films, an Introduction to HORIBA Solutions for Surface and Interface Characterization

Our solutions for Raman measurement of thin films

Raman spectroscopy stands as a precise method for measuring the thickness of thin films on every kind of substrate.

With instruments like LabRAM™ Soleil, XploRA™, and LabRAM™ Odyssey, HORIBA provides scientists with the perfect tools for this task. These devices offer high-resolution spectral analysis, enabling accurate determination of film thicknesses. HORIBA's commitment to innovation empowers scientists in their research and analysis endeavors.

With our highly accurate and reliable solutions, scientists can confidently explore the intricacies of thin films, and unlock new possibilities for technological development and innovation.

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