Job Specification - HORIBA

Corporate Korea

Products
Applications
Technologies
- Spectroscopy
  Cathodoluminescence
  Raman Spectroscopy
  AFM-Raman
  Fluorescence Spectroscopy
  Photoluminescence Spectroscopy
  Vaccum Ultra Violet
  Diffraction Gratings
  Monochromator and Spectrograph
  Detectors
  X-ray Fluorescence Spectroscopy (XRF)
  Spectroscopic Ellipsometry
- Microscopy and Imaging
  Raman Microscopy
  Cathodoluminescence
  Atomic Force Microscopy [AFM]
  AFM-Raman
  Nanoparticle Tracking Analysis
- Electrochemistry
  The Story of pH (Link to dedicated website)
  The Story of Ion
  The Story of ORP
  The Story of Conductivity
  The Story of Salt
  The Story of Dissolved Oxygen
- Physisorption
  Surface Area Measurements
- Particle Analysis
  Dynamic Light Scattering
  Static Light Scattering
  Molecular Weight
  Zeta Potential
  Image Analysis of Particles
  Nanoparticle Tracking Analysis
  Centrifugal Sedimentation
- Elemental Analysis
  Glow Discharge Optical Emission Spectroscopy (GDOES)
  Inductively Coupled Plasma - Optical Emission Spectroscopy (ICP-OES)
  Carbon/Sulfur & Oxygen/Nitrogen/Hydrogen Analysis
  X-ray Fluorescence Spectroscopy (XRF)
- Surface Plasmon Resonance
  Surface Plasmon Resonance imaging
Resources
Support
Contact

Country / Region

Oops, an error occurred! Code: 20260202011153607f71cb

Products

All Products (A-Z)
Mobility
Energy and Environment
Life Science
Healthcare
Materials
Semiconductor

Applications

Drinking Water Utilities
Automotive Manufacturing
Semiconductor Manufacturing Process
Research and Testing Laboratories

Technology

Glow Discharge Spectroscopy
Pressure-based Flowmetry
Quadrupole Mass Spectrometry
Raman Spectroscopy

Service

On-Site Support
Spare Parts and Consumables

Company

News
Events
Career
History
Corporate Culture

Contact

Career Contact
Contact Form
Worldwide Locations
Investor Relations Contact

Terms and Conditions Privacy Notice Cookies HORIBA Group Social Media