Magnetic Force Microscopy Module

Magnetic Force Microscopy Module Picture

External magnet for MFM measurements with high-NA optical access

Measurements in an external magnetic field reveal the true power of MFM

Magnetic Force Microscopy (MFM) is widely used to study magnetic domains and domain walls, Bloch lines, skyrmions, and other non-trivial magnetic structures in thin magnetic films and magnetic multilayers. Domain structures are highly sensitive to the applied external magnetic field: they emerge, evolve, and disappear as the field changes. They are also history-dependent and can differ even under identical field conditions. Each MFM image captures only a single state in this dynamic process. To build a complete picture of magnetic behavior, it is essential to acquire multiple MFM images automatically as the external magnetic field is varied. The SmartSPM equipped with the MFM module enables fully automated measurements of this kind.

Segment: Scientific
Manufacturing Company: HORIBA France SAS

For a brief explanation, watch this demo video:

  • Supports measurements in both in-plane and out-of-plane magnetic fields.
     
  • The applied field is fully reversible, supporting both negative and positive field polarities.
     
  • Field adjustment is achieved through the mechanical repositioning of permanent magnets, which completely eliminates sample heating — even at high field strengths — unlike conventional electromagnets.
     
  • When the SmartSPM is equipped with the magnetic system, it supports fully automated acquisition of hundreds of MFM images under various external magnetic fields following a user-defined measurement scenario.
     
  • The magnetic system has direct optical access to the specimen, thanks to the  Mitutoyo 100x objective, that can be used in both the top and side positions. This allows micro- and nano-Raman measurements to be performed using co-localized or TERS techniques.
     
  • The SmartSPM, equipped with a magnetic system, is fully compatible with SignatureSPM, OmegaScope, which can be equipped with protection enclosure for advanced environmental control.
Dimensions of the main block118 x 68 x 20 mm
Optical accessTop and side high-NA optical access
Smallest adjustable field increment0.2 mT or < 0.2 % of the range
Bi-directional repeatability< 1% of adjusted field
In-plane magnetic field (maximum)*± 570 mT at D = 0.5 mm
± 410 mT at D = 1 mm
Out-of-plane magnetic field (maximum)*± 190 mT at D = 0.5 mm
± 130 mT at D = 1 mm

*Maximum magnetic field depends on the distance D above the top plane of the magnet.

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