Thickness of Thin Film for Semiconductors

X-ray Analytical Microscope
with a Super Large Chamber

X-ray Analytical Microscope (Micro-XRF)

For Flat Panel Display and Photovoltaic Industries

Intuitive Auto-Soft Interface for the Auto SE and Smart SE

A Platform for HORIBA Scientific Ellipsometers

Ergonomic software for data acquisition, data treatment and technical support

In-situ spectroscopic ellipsometer for real-time thin film monitoring

Powerful and Cost Effective Spectroscopic Ellipsometer

Spectroscopic Ellipsometer for Simple Thin Film Measurement

Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm

A versatile spectroscopic ellipsometer covering a large range from VUV to NIR

Recall settings, and automate processes

Customize with VBS

X-ray Analytical Microscope

X-Ray Fluorescence Analyzer

X-Ray Fluorescence Analyzer